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Volumn 216, Issue 1, 2000, Pages 127-133

Study of the effect of polarity and of dislocations on the electrical and optoelectronic properties of p-type Cd0.96Zn0.04Te

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; CARRIER CONCENTRATION; CARRIER MOBILITY; CURRENT VOLTAGE CHARACTERISTICS; DISLOCATIONS (CRYSTALS); LEAKAGE CURRENTS; MICROHARDNESS; OHMIC CONTACTS; OPTOELECTRONIC DEVICES; PLASTIC DEFORMATION; SEMICONDUCTOR GROWTH; VICKERS HARDNESS TESTING;

EID: 0033723736     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(00)00452-8     Document Type: Article
Times cited : (9)

References (16)
  • 3
    • 85031560740 scopus 로고
    • Thèse de Doctorat de l'Université de Paris VI
    • K. Guergouri, Thèse de Doctorat de l'Université de Paris VI, 1987.
    • (1987)
    • Guergouri, K.1
  • 6
    • 85031557349 scopus 로고
    • Thèse de Doctorat ES Sciences Physiques de l'Université de Paris VI
    • B. Sieber, Thèse de Doctorat ES Sciences Physiques de l'Université de Paris VI, 1985.
    • (1985)
    • Sieber, B.1
  • 7
    • 85031564732 scopus 로고    scopus 로고
    • Rapport d'Activité. Université de Constantine
    • T. Kerbache, A. Chari, T. Benchaker, Rapport d'Activité. Université de Constantine, 1996.
    • (1996)
    • Kerbache, T.1    Chari, A.2    Benchaker, T.3
  • 14
    • 0003992521 scopus 로고
    • In: R.K Willardson, C. Beer (Eds.) Academic Press, New York
    • K. Zanio, In: R.K Willardson, C. Beer (Eds.) Semiconductors and Semi-metals, Academic Press, New York, 1978.
    • (1978) Semiconductors and Semi-metals
    • Zanio, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.