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Volumn 216, Issue 1, 2000, Pages 127-133
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Study of the effect of polarity and of dislocations on the electrical and optoelectronic properties of p-type Cd0.96Zn0.04Te
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Author keywords
[No Author keywords available]
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Indexed keywords
CAPACITANCE MEASUREMENT;
CARRIER CONCENTRATION;
CARRIER MOBILITY;
CURRENT VOLTAGE CHARACTERISTICS;
DISLOCATIONS (CRYSTALS);
LEAKAGE CURRENTS;
MICROHARDNESS;
OHMIC CONTACTS;
OPTOELECTRONIC DEVICES;
PLASTIC DEFORMATION;
SEMICONDUCTOR GROWTH;
VICKERS HARDNESS TESTING;
BRIDGMAN METHOD;
CADMIUM ZINC TELLURIDE;
POLARITY;
SEMICONDUCTING CADMIUM TELLURIDE;
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EID: 0033723736
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(00)00452-8 Document Type: Article |
Times cited : (9)
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References (16)
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