Traceable measurement of surface texture at the National Physical Laboratory using NanoSurf IV

Measurement Science and Technology

Volumn 11, Issue 8, 2000, Pages 1162-1172

  Leach, Richard K ^a  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; INTERFEROMETRY; SURFACE PHENOMENA; SURFACES;

STYLUS INSTRUMENT; SURFACE TEXTURE MEASUREMENT; TRACEABLE DISPLACEMENT MEASUREMENT; TRANSFER STANDARDS;

SPATIAL VARIABLES MEASUREMENT;

EID: 0034246242     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/11/8/310     Document Type: Article

References (30)