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International Journal of Machine Tools and Manufacture

Volumn 41, Issue 13-14, 2001, Pages 2123-2137

Proposal for a guideline to calibrate interference microscopes for use in roughness measurements

(2) Kruger Sehm R a Luna Perez, J A b

a PHYSIKALISCH TECHNISCHE BUNDESANSTALT (Germany)

b CERN (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; CORRELATION METHODS; IMAGING SYSTEMS; INTERFEROMETRY; OPTICAL MICROSCOPY; SENSITIVITY ANALYSIS; SPURIOUS SIGNAL NOISE; STANDARDS; SURFACE ROUGHNESS;

INTERFERENCE MICROSCOPES;

ROUGHNESS MEASUREMENT;

EID: 0035479516 PISSN: 08906955 EISSN: None Source Type: Journal
DOI: 10.1016/S0890-6955(01)00079-7 Document Type: Article

Times cited : (9)

References (14)

1
- 0003800106
- DKD-R-4-2 Blatt 2
- (1991) Richtlinie zum Kalibrieren von Tastschnittgeräten im Deutschen Kalibrierdienst

2
- 4243936868
- EAL G-20
- Calibration of stylus instruments for measuring surface roughness

3
- 0003790880
- ISO 5436-1
- Calibration Specimens - Stylus Instruments - Types, Calibration and Use

4
- 0004033642
- ISO 4287
- Surface-texture-profile Method - Terms, Definitions and Surface Texture Parameters

5
- 0004033642
- ISO 4288
- Surface-texture-profile Method - Rules and Procedures for the Assessment of Surface Texture

6
- 0003921635
- ISO 11562
- Surface-texture-profile Method - Metrological Characteristics of Phase Correct Filters

7
- 0003882935
- Brussels
- (1993) BCR-Report, Development of Methods for the Characterisation of Roughness in Three Dimensions
- Stout, K.¹

8
- 0003732610
- ISO 3274
- Surface-texture-profile Method - Nominal Characteristics of Contact Stylus Instruments

9
- 84876628664
- ISO 12853
- Optic and Optical Instruments - Microscopes - Information for the User

10
- 79960771878
- Manufacturing and metrological properties of ultrafine roughness standards with irregular profile
- IPES Seminar
- (1997) Progress in Precision Engineering and Nanotechnology , vol.2 , pp. 544-547
- Jäger, V.¹ Krüger, R.²

11
- 0030260553
- Capabilities and limitations of interference microscopy for two- and three-dimensional surface-measuring technology
- (1996) Measurement , vol.19 , Issue.2 , pp. 95-102
- Brand, U.¹ Hillmann, W.² Krystek, M.³

12
- 0003868067
- 5-6 May
- (1999) Berechnung der Messunsicherheit beim Kalibrieren von Normalen Proceedings DIN-Session "GPS 99" , pp. 31-317
- Krüger-Sehm, R.¹ Krystek, M.²

13
- 84940098724
- Uncertainty analysis on roughness measurement
- Chemnitz, Additional Papers
- (2000) Proceedings of X. Int. Coll. on surfaces
- Krüger-Sehm, R.¹ Krystek, M.²

14
- 0003803581
- Einfluss des wellenfilters auf die unsicherheit eines messergebnisses bei rauheitsmessungen
- 5-6 May
- (1999) Proceedings DIN-Session "GPS 99" , pp. 41-411
- Krystek, M.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.