Ion beam analysis: A century of exploiting the electronic and nuclear structure of the atom for materials characterisation

Reviews of Accelerator Science and Technology: Accelerator Applications in Industry and the Environment

Volumn , Issue , 2012, Pages 41-82

  Jeynes, Chris ^a   Webb, Roger P ^a   Lohstroh, Annika ^a  

^a UNIVERSITY OF SURREY   (United Kingdom)

Author keywords

EBS; ERD; IBIC; LEIS; MEIS; NRA; PIXE; RBS; SIMS

Indexed keywords

BACKSCATTERING; CRYSTAL ATOMIC STRUCTURE; DEPTH PROFILING; ION MICROSCOPES; RUBIDIUM; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SECONDARY ION MASS SPECTROMETRY; THIN FILMS;

DEFECTS IN SEMICONDUCTORS; IBIC; INTEGRATED APPROACH; LEIS; MATERIALS CHARACTERISATION; MEIS; PARTICLE INDUCED X-RAY EMISSION; PIXE;

ION BEAMS;

EID: 84863941723     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1142/S1793626811000483     Document Type: Chapter

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