PIXE-quantified AXSIA: Elemental mapping by multivariate spectral analysis

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 249, Issue 1-2 SPEC. ISS., 2006, Pages 828-832

  Doyle, B L ^a   Provencio, P P ^a   Kotula, P G ^a   Antolak, A J ^b   Ryan, C G ^c   Campbell, J L ^d   Barrett, K ^e  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

^c CSIRO   (Australia)

^d UNIVERSITY OF GUELPH   (Canada)

^e Primecore Systems   (United States)

Author keywords

AXSIA; Multivariate spectral analysis; PIXE; Proton induced X ray emission

Indexed keywords

IMAGE ANALYSIS; IMAGE QUALITY; MAPS; MULTIVARIABLE SYSTEMS; SPECTRUM ANALYSIS; STATISTICAL METHODS;

AUTOMATED EXPERT SPECTRAL IMAGE ANALYSIS (AXSIA); MULTIVARIATE CURVE RESOLUTION; MULTIVARIATE SPECTRAL ANALYSIS; PROTON INDUCED X-RAY EMISSION (PIXE);

NUCLEAR INSTRUMENTATION;

EID: 33746075186     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.03.184     Document Type: Article

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