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Volumn 78, Issue 7, 2007, Pages
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Development of a high-efficiency high-resolution particle-induced x-ray emission system for chemical state analysis of environmental samples
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL ANALYSIS;
CRYSTAL STRUCTURE;
MOLECULAR DYNAMICS;
SILICON;
X RAY SPECTROSCOPY;
CHEMICAL STATE IDENTIFICATION;
HAMOS-TYPE CRYSTAL SPECTROMETER;
PARTICLE-INDUCED X-RAY EMISSION (PIXE);
TRACE ELEMENTS;
ARTICLE;
CHEMISTRY;
ENVIRONMENTAL MONITORING;
EQUIPMENT;
EQUIPMENT DESIGN;
EVALUATION;
INSTRUMENTATION;
LABORATORY DIAGNOSIS;
METHODOLOGY;
PARTICLE SIZE;
REPRODUCIBILITY;
SENSITIVITY AND SPECIFICITY;
SPECTROMETRY;
ENVIRONMENTAL MONITORING;
EQUIPMENT DESIGN;
EQUIPMENT FAILURE ANALYSIS;
MICROCHEMISTRY;
PARTICLE SIZE;
REPRODUCIBILITY OF RESULTS;
SENSITIVITY AND SPECIFICITY;
SPECIMEN HANDLING;
SPECTROMETRY, X-RAY EMISSION;
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EID: 34547601754
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2756623 Document Type: Article |
Times cited : (27)
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References (22)
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