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Volumn 78, Issue 7, 2007, Pages

Development of a high-efficiency high-resolution particle-induced x-ray emission system for chemical state analysis of environmental samples

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ANALYSIS; CRYSTAL STRUCTURE; MOLECULAR DYNAMICS; SILICON; X RAY SPECTROSCOPY;

EID: 34547601754     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2756623     Document Type: Article
Times cited : (27)

References (22)
  • 14
    • 34547603027 scopus 로고    scopus 로고
    • J. H. Hubbell and S. M. Seltzer, Tables of x-ray Mass Attenuation Coefficients and Mass Energy-Absorption Coefficients, National Institute of Standards and Technology (http://physics.nist.gov/PhysRefData/XrayMassCoef/ cover.html).
    • Hubbell, J.H.1    Seltzer, S.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.