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Volumn 268, Issue 11-12, 2010, Pages 1768-1771

Stopping power of 11B in Si and TiO2 measured with a bulk sample method and Bayesian inference data analysis

Author keywords

Electronic stopping; RBS; Silicon; Titanium oxide

Indexed keywords

BAYESIAN INFERENCE; BAYESIAN INFERENCE ANALYSIS; BULK SAMPLES; DATA ANALYSIS; ELECTRONIC STOPPING; EXPERIMENTAL DATA; RBS; STOPPING POWER; TIO;

EID: 77953128896     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2010.02.070     Document Type: Article
Times cited : (10)

References (28)
  • 28
    • 4344625224 scopus 로고
    • Meyer O., Linker G., and Käppeler F. (Eds), Plenum Press, New York
    • Blewer R.S. In: Meyer O., Linker G., and Käppeler F. (Eds). Ion Beam Surface Layer Analysis (1976), Plenum Press, New York
    • (1976) Ion Beam Surface Layer Analysis
    • Blewer, R.S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.