Holistic RBS-PIXE data reanalysis of SBT thin film samples

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 261, Issue 1-2 SPEC. ISS., 2007, Pages 439-442

  Reis, M A ^a   Barradas, N P ^a,b   Pascual Izarra, C ^a   Chaves, P C ^a   Ramos, A R ^a,b   Alves, E ^a,b   Gonzalez Aguilar G ^c   Costa, M E V ^d   Miranda Salvado, I M ^d  

^a INSTITUTO TECNOLÓGICO E NUCLEAR   (Portugal)

^b CENTRO DE FÍSICA NUCLEAR DA UNIVERSIDADE DE LISBOA   (Portugal)

^c INSTITUTO DE ESTRUCTURA DE LA MATERIA   (Spain)

^d UNIVERSITY OF AVEIRO   (Portugal)

Author keywords

RBS PIXE; SBT films

Indexed keywords

HOLISTIC ANALYSIS; STRUCTURE INFORMATION;

DATA RECORDING; FERROELECTRIC MATERIALS; LARGE SCALE SYSTEMS; PLATINUM; SOLID STATE REACTIONS; STRONTIUM COMPOUNDS;

THIN FILMS;

EID: 34447304364     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2007.04.284     Document Type: Article

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