Depth profiling of fingerprint and ink signals by SIMS and MeV SIMS

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 268, Issue 11-12, 2010, Pages 1929-1932

  Bailey, M J ^a   Jones, B N ^a   Hinder, S ^a   Watts, J ^a   Bleay, S ^b   Webb, R P ^a  

^a UNIVERSITY OF SURREY   (United Kingdom)

^b Home Office Central Research Establishment   (United Kingdom)

Author keywords

Fingerprints; Forensic Science; Ion Beam Analysis; Secondary ion mass spectrometry

Indexed keywords

ANALYTICAL METHOD; FORENSIC SCIENCE; ION BEAM ANALYSIS; MOLECULAR FRAGMENTS; SECONDARY IONS; WRITTEN TEXTS;

BEAM PLASMA INTERACTIONS; DEPTH PROFILING; INK; ION BEAMS; ION BOMBARDMENT; LAW ENFORCEMENT; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SPECTROMETRY;

IONS;

EID: 77953130213     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2010.02.104     Document Type: Article

References (17)

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