"total IBA" - Where are we?

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 271, Issue , 2012, Pages 107-118

  Jeynes, C ^a   Bailey, M J ^a   Bright, N J ^a   Christopher, M E ^a   Grime, G W ^a   Jones, B N ^a   Palitsin, V V ^a   Webb, R P ^a  

^a UNIVERSITY OF SURREY   (United Kingdom)

Author keywords

Accurate analysis; Blind samples; Certified reference materials; Elemental depth profiling; Forensics; High sensitivity; Ion beam analysis; Mapping; Particle induced X ray analysis; Rutherford backscattering; SIMS standards; Thin films; Trace elements; Uncertainty budget

Indexed keywords

BACKSCATTERING; BUDGET CONTROL; DEPTH PROFILING; FILMS; MAPPING; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SPECTROMETRY; THIN FILMS; TRACE ELEMENTS; UNCERTAINTY ANALYSIS; X RAY ANALYSIS;

ACCURATE ANALYSIS; CERTIFIED REFERENCE MATERIALS; ELEMENTAL DEPTH PROFILING; FORENSICS; HIGH SENSITIVITY; ION BEAM ANALYSIS; UNCERTAINTY BUDGET;

ION BEAMS;

EID: 82455175419     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2011.09.020     Document Type: Review

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99. C. Jeynes, N.P. Barradas, H. Rafla-Yuan, B.P. Hichwa, and R. Close Accurate depth profiling of complex optical coatings Surf. Interface Anal. 30 2000 237 242
100. M. Kavcić, M. Zitnik, K. Bucar, and J. Szlachetko Application of wavelength dispersive X-ray spectroscopy to improve detection limits in X-ray analysis X-Ray Spectrom. 40 1 2011 2 6
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102. M. Kavcić, A.G. Karydas, and C. Zarkadas Chemical state analysis employing sub-natural linewidth resolution PIXE measurements of K alpha diagram lines X-Ray Spectrom. 34 2005 310 314 (Pubitemid 41016917)
103. A.N. Mansour, and C.A. Melendres Analysis of X-ray absorption spectra of some nickel oxycompounds using theoretical standards J. Phys. Chem. A 102 1998 65 81 (Pubitemid 128606245)
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106. Brian N. Jones, Jiro Matsuo, Yoshihiko Nakata, Hideaki Yamada, John Watts, Steven Hinder, Vladimir Palitsin, and Roger Webb Comparison of MeVmonomer ion and keV cluster ToF-SIMS Surf. Interface Anal. 43 2011 249 252
107. Yoshinobu Wakamatsu, Hideaki Yamada, Satoshi Ninomiya, Brian N. Jones, Toshio Seki, Takaaki Aoki, Roger Webb, Jiro Matsuo, Biomolecular Emission by Swift Heavy Ion Bombardment, Ion Implantation Technology, in: J. Matsuo, M. Kase, T. Aoki, T. Seki (Eds.), AIP, CP1321, 2010, pp. 233-236.
108. M.J. Bailey, B.N. Jones, S. Hinder, J. Watts, S. Bleay, and R.P. Webb Depth profiling of fingerprint and ink signals by SIMS and MeV SIMS Nucl. Instrum. Methods B 268 11-12 2010 1929 1932
109. Brian N. Jones, Vladimir Palitsin, and Roger Webb Surface analysis with high energy time-of-flight secondary ion mass spectrometry measured in parallel with PIXE and RBS Nucl. Instrum. Methods B 268 11-12 2010 1714 1717
110. Jiro Matsuo, Satoshi Ninomiya, Hideaki Yamada, Kazuya Ichiki, Yoshinobu Wakamatsu, Masaki Hada, Toshio Sekib, and Takaaki Aoki SIMS with highly excited primary beams for molecular depth profiling and imaging of organic and biological materials Surf. Interface Anal 42 2010 1612 1615
111. F.R.M. Benton, L. Sundar, J. Ma, Direct detection of nicotine and cotinine in dusted latent fingermarks from smokers using hydrophobic silica particles and MS, in: M.J. Bailey (Ed.), Surface and Interface Analysis, special ed., doi: 10.1002/sia.3112, in press.
112. D.R. Ifa, N.E. Manicke, A.L. Dill, and R.G. Cooks Latent fingerprint chemical imaging by mass spectrometry Science 321 2008 805
113. N.P. Barradas, J.L. Keddie, and R. Sackin Bayesian inference analysis of ellipsometry data Phys. Rev. E 59 1999 6138 6151 (Pubitemid 129690437)
114. N.P. Barradas, J. Likonen, E. Alves, L.C. Alves, P. Coad, A. Hakola, A. Widdowson, Integration of SIMS into a general purpose IBA code, AIP Conference Proceedings 1336: 21st Conference for the Application of Accelerators in Research and Industry, 2010, pp. 281-285.
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116. J.L. Campbell, J.A. Maxwell, S.M. Andrushenko, S.M. Taylor, B.N. Jones, and W. Brown-Bury A GUPIX-based approach to interpreting the PIXE-plus-XRF spectra from the Mars Exploration Rovers: I. Homogeneous Standards Nucl. Instrum. Methods B 269 1 2011 57 68
117. J.L. Campbell, A.M. McDonald, G.M. Perrett, and S.M. Taylor A GUPIX-based approach to interpreting the PIXE-plus-XRF spectra from the Mars Exploration Rovers: II Geochemical Reference Materials Nucl. Instrum. Methods B 269 1 2011 69 81
118. J.R. Michalski, and P.B. Niles Deep crustal carbonate rocks exposed by meteor impact on Mars Nat. Geosci. 3 11 2010 751 755