Application of wavelength dispersive X-ray spectroscopy to improve detection limits in X-ray analysis

X-Ray Spectrometry

Volumn 40, Issue 1, 2011, Pages 2-6

  Kavcic M ^a   Zitnik M ^a   Bucar K ^a   Szlachetko, J ^b,c  

^a JO EF STEFAN INSTITUTE   (Slovenia)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c JAN KOCHANOWSKI UNIVERSITY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; ELECTROMAGNETIC WAVE EMISSION; SPECTROMETERS; SYNCHROTRON RADIATION; SYNCHROTRONS; TRACE ELEMENTS; X RAY SCATTERING; X RAY SPECTROSCOPY;

ATOMIC NUMBERS; CRYSTAL SPECTROMETER; DETECTION LIMITS; HIGH RESOLUTION; L X-RAYS; MINIMUM DETECTION LIMITS; TRACE AMOUNTS; WAVELENGTH DISPERSIVE X-RAY SPECTROSCOPIES; X-RAY EMISSION; X-RAY EMISSION SPECTRA;

EMISSION SPECTROSCOPY;

EID: 79551640159     PISSN: 00498246     EISSN: 10974539     Source Type: Journal    
DOI: 10.1002/xrs.1291     Document Type: Article

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