메뉴 건너뛰기




Volumn 30, Issue 1, 2011, Pages 142-174

Developments in molecular SIMS depth profiling and 3D imaging of biological systems using polyatomic primary ions

Author keywords

mass spectral imaging; molecular depth profiling; SIMS; single cells; tissue

Indexed keywords

2D IMAGING; 3D IMAGING; CHEMICAL SPECIFICITY; DUTY CYCLES; DYNAMIC SIGNALS; HIGH YIELD; IONIZATION EFFICIENCY; LATERAL RESOLUTION; LOW DAMAGES; MASS RESOLUTION; MASS SPECTRAL; MATRIX EFFECTS; METAL CLUSTER; MOLECULAR CHEMISTRY; MOLECULAR DEPTH PROFILING; MOLECULAR IMAGING; MOLECULAR IONS; MOLECULAR SPECIES; NEW APPROACHES; NEW INSTRUMENT; POLYATOMIC ION; POLYATOMIC PRIMARY IONS; PRIMARY BEAMS; SIGNAL LEVEL; SIMS; SIMS IMAGING; SINGLE CELLS; SPATIAL ANALYSIS; SPATIAL RESOLUTION; STATIC LIMITS; SUBMICRON; TISSUE ANALYSIS; TOF SIMS;

EID: 78650708928     PISSN: 02777037     EISSN: 10982787     Source Type: Journal    
DOI: 10.1002/mas.20275     Document Type: Article
Times cited : (135)

References (92)
  • 2
    • 36749116628 scopus 로고
    • Nonlinear effects in heavy-ion sputtering
    • Andersen HH, Bay HL,. 1974. Nonlinear effects in heavy-ion sputtering. J Appl Phys 45: 953-9954.
    • (1974) J Appl Phys , vol.45 , pp. 953-9954
    • Andersen, H.H.1    Bay, H.L.2
  • 4
    • 0000681363 scopus 로고
    • Comparison of polyatomic and atomic primary beams for secondary ion mass spectrometry of organics
    • Appelhans AD, Delmore JE,. 1989. Comparison of polyatomic and atomic primary beams for secondary ion mass spectrometry of organics. Anal Chem 61: 1087.
    • (1989) Anal Chem , vol.61 , pp. 1087
    • Appelhans, A.D.1    Delmore, J.E.2
  • 5
    • 1242289947 scopus 로고
    • Secondary ion emission under cluster impact at low energies (5-60 keV); Influence of the number of atoms in the projectile
    • Baudin K, Bolbach G, Brunelle A, Della-Negra S, HÃkansson P, Le Beyec Y,. 1994. Secondary ion emission under cluster impact at low energies (5-60 keV); influence of the number of atoms in the projectile. Nucl Instrum Methods B88: 160.
    • (1994) Nucl Instrum Methods , vol.88 B , pp. 160
    • Baudin, K.1    Bolbach, G.2    Brunelle, A.3    Della-Negra, S.4    Hãkansson, P.5    Le Beyec, Y.6
  • 7
    • 0017538366 scopus 로고
    • A model of secondary electron yields from atomic and polyatomic ion impacts on copper and tungsten surfaces based upon stopping-power calculations
    • Beuhler RJ, Friedmann J,. 1977. A model of secondary electron yields from atomic and polyatomic ion impacts on copper and tungsten surfaces based upon stopping-power calculations. J Appl Phys 48: 3928.
    • (1977) J Appl Phys , vol.48 , pp. 3928
    • Beuhler, R.J.1    Friedmann, J.2
  • 9
    • 34447568367 scopus 로고    scopus 로고
    • The chemical composition of animal cells and their intracellular compartments reconstructed from 3D mass spectrometry
    • Breitenstein D, Rommel CE, Möllers R, Wegener J, Hagenhoff B,. 2007. The chemical composition of animal cells and their intracellular compartments reconstructed from 3D mass spectrometry. Angew Chem Int Ed 46: 5332-5335.
    • (2007) Angew Chem Int Ed , vol.46 , pp. 5332-5335
    • Breitenstein, D.1    Rommel, C.E.2    Möllers, R.3    Wegener, J.4    Hagenhoff, B.5
  • 11
    • 0034142048 scopus 로고    scopus 로고
    • Subcellular imaging by dynamic SIMS ion microscopy
    • Chandra S, Smith DR, Morrison GH,. 2000. Subcellular imaging by dynamic SIMS ion microscopy. Anal Chem 72: 104A-114A.
    • (2000) Anal Chem , vol.72
    • Chandra, S.1    Smith, D.R.2    Morrison, G.H.3
  • 13
    • 33646402049 scopus 로고    scopus 로고
    • Molecular depth profiling with cluster beams
    • Cheng J, Wucher A, Winograd N,. 2006. Molecular depth profiling with cluster beams. J Phys Chem B 110: 8329-8336.
    • (2006) J Phys Chem B , vol.110 , pp. 8329-8336
    • Cheng, J.1    Wucher, A.2    Winograd, N.3
  • 14
    • 33847049337 scopus 로고    scopus 로고
    • Direct comparison of + $ and $ + $ cluster projectiles in SIMS molecular depth profiling
    • Cheng J, Kozole J, Hengstebeck R, Winograd N,. 2007. Direct comparison of $ + $ and $ + $ cluster projectiles in SIMS molecular depth profiling. J Am Soc Mass Spectrom 18: 406-412.
    • (2007) J Am Soc Mass Spectrom , vol.18 , pp. 406-412
    • Cheng, J.1    Kozole, J.2    Hengstebeck, R.3    Winograd, N.4
  • 15
    • 33645894181 scopus 로고    scopus 로고
    • Is proton cationization promoted by polyatomic primary ion bombardment during time-of-flight secondary ion mass spectrometry analysis of frozen aqueous solutions
    • Conlan XA, Lockyer NP, Vickerman JC,. 2006. Is proton cationization promoted by polyatomic primary ion bombardment during time-of-flight secondary ion mass spectrometry analysis of frozen aqueous solutions ? Rapid Commun Mass Spectrom 20: 1327-1334.
    • (2006) Rapid Commun Mass Spectrom , vol.20 , pp. 1327-1334
    • Conlan, X.A.1    Lockyer, N.P.2    Vickerman, J.C.3
  • 18
    • 33845873923 scopus 로고    scopus 로고
    • Attempts for molecular depth profiling directly on a rat brain tissue section using fullerene and bismuth cluster ion beams
    • Debois D, Brunelle A, Laprevote O,. 2007. Attempts for molecular depth profiling directly on a rat brain tissue section using fullerene and bismuth cluster ion beams. Int J Mass Spectrom 260: 115-120.
    • (2007) Int J Mass Spectrom , vol.260 , pp. 115-120
    • Debois, D.1    Brunelle, A.2    Laprevote, O.3
  • 19
    • 65349103483 scopus 로고    scopus 로고
    • Situ lipidomic analysis of nonalcoholic fatty liver by cluster TOF-SIMS imaging'
    • Debois D, Bralet M-P, Le Naour F, Brunelle A, Laprévote O,. 2009. In situ lipidomic analysis of nonalcoholic fatty liver by cluster TOF-SIMS imaging'. Anal Chem 81: 2823-2831.
    • (2009) Anal Chem , vol.81 , pp. 2823-2831
    • Debois, D.1    Bralet, M.-P.2    Le Naour, F.3    Brunelle, A.4    Laprévote, O.5
  • 21
    • 33947406843 scopus 로고    scopus 로고
    • TOF-SIMS 3D biomolecular imaging of Xenopus laevis oocytes using buckminsterfullerene $ 60+$ primary ions
    • Fletcher JS, Lockyer NP, Vaidyanathan S, Vickerman JC,. 2007. TOF-SIMS 3D biomolecular imaging of Xenopus laevis oocytes using buckminsterfullerene $ 60 +$ primary ions. Anal Chem 79: 2199-2206.
    • (2007) Anal Chem , vol.79 , pp. 2199-2206
    • Fletcher, J.S.1    Lockyer, N.P.2    Vaidyanathan, S.3    Vickerman, J.C.4
  • 24
    • 72849147267 scopus 로고    scopus 로고
    • A new SIMS paradigm for 2D and 3D molecular imaging of bio-systems
    • 10.1007/s00216-009-2986-3.
    • Fletcher JS, Vickerman JC,. 2009. A new SIMS paradigm for 2D and 3D molecular imaging of bio-systems. Anal Bioanal Chem 10.1007/s00216-009-2986-3.
    • (2009) Anal Bioanal Chem
    • Fletcher, J.S.1    Vickerman, J.C.2
  • 25
    • 55349113272 scopus 로고    scopus 로고
    • Computational view of surface based organic mass spectrometry
    • Garrison BJ, Postawa Z,. 2008. Computational view of surface based organic mass spectrometry. Mass Spectrom Rev 27: 289.
    • (2008) Mass Spectrom Rev , vol.27 , pp. 289
    • Garrison, B.J.1    Postawa, Z.2
  • 26
    • 0025506308 scopus 로고
    • Molecular in imaging and dynamic secondary ion mass spectrometry of organic compounds
    • Gillen G, Simmons DS, Williams P,. 1990. Molecular in imaging and dynamic secondary ion mass spectrometry of organic compounds. Anal Chem 62: 2122-2130.
    • (1990) Anal Chem , vol.62 , pp. 2122-2130
    • Gillen, G.1    Simmons, D.S.2    Williams, P.3
  • 27
    • 0031595216 scopus 로고    scopus 로고
    • Preliminary evaluation of an $ + $ polyatomic primary ion beam for analysis of organic thin films by secondary ion mass spectrometry
    • Gillen G, Roberson S,. 1998. Preliminary evaluation of an $ + $ polyatomic primary ion beam for analysis of organic thin films by secondary ion mass spectrometry. Rapid Commun Mass Spectrom 12: 1303-1312.
    • (1998) Rapid Commun Mass Spectrom , vol.12 , pp. 1303-1312
    • Gillen, G.1    Roberson, S.2
  • 28
    • 0035272636 scopus 로고    scopus 로고
    • Negative cesium sputter ion source for generating cluster primary ion beams for secondary ion mass spectrometry analysis
    • Gillen G, King L, Freibaum B, Lareau R, Bennett J, Chmara F,. 2001. Negative cesium sputter ion source for generating cluster primary ion beams for secondary ion mass spectrometry analysis. J Vac Sci Technol A 19: 568-575.
    • (2001) J Vac Sci Technol A , vol.19 , pp. 568-575
    • Gillen, G.1    King, L.2    Freibaum, B.3    Lareau, R.4    Bennett, J.5    Chmara, F.6
  • 31
    • 0001442614 scopus 로고
    • Spike effects in heavy-ion sputtering of Ag, Au and Pt thin films
    • Johar SS, Thompson DA,. 1979. Spike effects in heavy-ion sputtering of Ag, Au and Pt thin films. Surf Sci 90: 319-330.
    • (1979) Surf Sci , vol.90 , pp. 319-330
    • Johar, S.S.1    Thompson, D.A.2
  • 32
    • 0001936501 scopus 로고    scopus 로고
    • Static secondary ion mass spectrometry (SSIMS) of biological compounds in tissue and tissue-like matrices
    • John CM, Odom RW,. 1997. Static secondary ion mass spectrometry (SSIMS) of biological compounds in tissue and tissue-like matrices. Int J Mass Spectrom Ion Process 161: 47-67.
    • (1997) Int J Mass Spectrom Ion Process , vol.161 , pp. 47-67
    • John, C.M.1    Odom, R.W.2
  • 33
    • 33747164787 scopus 로고    scopus 로고
    • Suppression and enhancement of non-native molecules within biological systems
    • Jones EA, Lockyer NP, Vickerman JC,. 2006. Suppression and enhancement of non-native molecules within biological systems. Appl Surf Sci 252: 6727.
    • (2006) Appl Surf Sci , vol.252 , pp. 6727
    • Jones, E.A.1    Lockyer, N.P.2    Vickerman, J.C.3
  • 34
    • 33845875511 scopus 로고    scopus 로고
    • Mass spectral analysis and imaging of tissue by ToF-SIMS-The role of buckminsterfullerene, $60 + $, primary ions
    • Jones EA, Lockyer NP, Vickerman JC,. 2007. Mass spectral analysis and imaging of tissue by ToF-SIMS-The role of buckminsterfullerene, $ + $, primary ions. Int J Mass Spectrom 260: 146-1157.
    • (2007) Int J Mass Spectrom , vol.260 , pp. 146-1157
    • Jones, E.A.1    Lockyer, N.P.2    Vickerman, J.C.3
  • 35
    • 34547132563 scopus 로고    scopus 로고
    • Suppression and enhancement of secondary ion formation due to the chemical environment in static-secondary ion mass spectrometry
    • Jones EA, Lockyer NP, Kordys J, Vickerman JC,. 2007b. Suppression and enhancement of secondary ion formation due to the chemical environment in static-secondary ion mass spectrometry. J Am Soc Mass Spectrom 18: 1559-1567.
    • (2007) J Am Soc Mass Spectrom , vol.18 , pp. 1559-1567
    • Jones, E.A.1    Lockyer, N.P.2    Kordys, J.3    Vickerman, J.C.4
  • 36
    • 41449108483 scopus 로고    scopus 로고
    • Depth profiling brain tissue sections with a 40 keV $60 + $ primary ion beam
    • Jones EA, Lockyer NP, Vickerman JC,. 2008. Depth profiling brain tissue sections with a 40 keV $60 + $ primary ion beam. Anal Chem 80: 2125-2132.
    • (2008) Anal Chem , vol.80 , pp. 2125-2132
    • Jones, E.A.1    Lockyer, N.P.2    Vickerman, J.C.3
  • 37
    • 2942556905 scopus 로고    scopus 로고
    • Influence of primary ion bombardment conditions on the emission of molecular secondary ions
    • Kersting R, Hagenhoff B, Kollmer F, Möllers R, Niehuis E,. 2004. Influence of primary ion bombardment conditions on the emission of molecular secondary ions. Appl Surf Sci 231/232: 261.
    • (2004) Appl Surf Sci , vol.231-232 , pp. 261
    • Kersting, R.1    Hagenhoff, B.2    Kollmer, F.3    Möllers, R.4    Niehuis, E.5
  • 40
    • 0037329166 scopus 로고    scopus 로고
    • MALDI ionisation: The role of in plume processes
    • Knochenmuss R, Zenobi R,. 2003. MALDI ionisation: The role of in plume processes. Chem Rev 103: 441-452.
    • (2003) Chem Rev , vol.103 , pp. 441-452
    • Knochenmuss, R.1    Zenobi, R.2
  • 41
    • 2942594079 scopus 로고    scopus 로고
    • Cluster primary ion bombardment of organic materials
    • Kollmer F,. 2004. Cluster primary ion bombardment of organic materials. Appl Surf Sci 231/232: 153.
    • (2004) Appl Surf Sci , vol.231-232 , pp. 153
    • Kollmer, F.1
  • 42
    • 56449090766 scopus 로고    scopus 로고
    • The effect of incident angle on the $60 + $ bombardment of molecular solids
    • Kozole J, Willingham D, Winograd N,. 2008. The effect of incident angle on the $60 + $ bombardment of molecular solids. Appl Surf Sci 255: 1068-1070.
    • (2008) Appl Surf Sci , vol.255 , pp. 1068-1070
    • Kozole, J.1    Willingham, D.2    Winograd, N.3
  • 43
    • 0031871699 scopus 로고    scopus 로고
    • Suppression effects in enzymatic peptide ladder sequencing using ultraviolet-matrix assisted laser desorption/ionization-mass spectrometry
    • Kratzer R, Eckerskorn C, Karas M, Lottspeich F,. 1998. Suppression effects in enzymatic peptide ladder sequencing using ultraviolet-matrix assisted laser desorption/ionization-mass spectrometry. Electrophoresis 19: 1910.
    • (1998) Electrophoresis , vol.19 , pp. 1910
    • Kratzer, R.1    Eckerskorn, C.2    Karas, M.3    Lottspeich, F.4
  • 44
    • 0346168630 scopus 로고    scopus 로고
    • Cluster impacts at keV and MeV energies: Secondary emission phenomena
    • Le Beyec Y,. 1998. Cluster impacts at keV and MeV energies: Secondary emission phenomena. Int J Mass Spectrom Ion Process 174: 101.
    • (1998) Int J Mass Spectrom Ion Process , vol.174 , pp. 101
    • Le Beyec, Y.1
  • 45
    • 0026221803 scopus 로고
    • Application of a tandem analyzer to SIMS studies of hydrocarbon polymers
    • Leggett GJ, Briggs D, Vickerman JC,. 1991. Application of a tandem analyzer to SIMS studies of hydrocarbon polymers. Surf Interface Anal 17: 737-7744.
    • (1991) Surf Interface Anal , vol.17 , pp. 737-7744
    • Leggett, G.J.1    Briggs, D.2    Vickerman, J.C.3
  • 46
    • 0001253379 scopus 로고
    • An empirical model for ion formation from polymer surfaces during analysis by secondary-ion mass spectrometry
    • Leggett GJ, Vickerman JC,. 1992. An empirical model for ion formation from polymer surfaces during analysis by secondary-ion mass spectrometry. Int. J Mass Spectrom Ion Process 122: 281-319.
    • (1992) Int. J Mass Spectrom Ion Process , vol.122 , pp. 281-319
    • Leggett, G.J.1    Vickerman, J.C.2
  • 47
    • 2642547265 scopus 로고    scopus 로고
    • Depth profiling of 4-acetamindophenol-doped poly(lactic acid) films using cluster secondary ion mass spectrometry
    • Mahoney CM, Roberson SV, Gillen G,. 2004. Depth profiling of 4-acetamindophenol-doped poly(lactic acid) films using cluster secondary ion mass spectrometry. Anal Chem 76: 3199-3207.
    • (2004) Anal Chem , vol.76 , pp. 3199-3207
    • Mahoney, C.M.1    Roberson, S.V.2    Gillen, G.3
  • 48
    • 0003041338 scopus 로고
    • Pitfalls on the road to the ideal time-of-flight mirror: Ideal time-focusing in the second stage of tandem mass spectrometers
    • Makarov AA, Raptakis EN, Derrick PJ,. 1995. Pitfalls on the road to the ideal time-of-flight mirror: ideal time-focusing in the second stage of tandem mass spectrometers. Int. J Mass Spectrom Ion Process 146: 165-182.
    • (1995) Int. J Mass Spectrom Ion Process , vol.146 , pp. 165-182
    • Makarov, A.A.1    Raptakis, E.N.2    Derrick, P.J.3
  • 49
    • 69749083754 scopus 로고    scopus 로고
    • Fixation and drying protocols for the preparation of cell samples for TOF-SIMS analysis
    • Malm J, Giannaras D, Riehle MO, Gadegaard N, Sjövall P,. 2009. Fixation and drying protocols for the preparation of cell samples for TOF-SIMS analysis. Anal Chem 81: 7197-7205.
    • (2009) Anal Chem , vol.81 , pp. 7197-7205
    • Malm, J.1    Giannaras, D.2    Riehle, M.O.3    Gadegaard, N.4    Sjövall, P.5
  • 51
    • 0005013427 scopus 로고
    • Organic ion imaging beyond the limit of static secondary ion mass spectrometry
    • McMahon JM, Dookeran NN, Todd PJ,. 1995. Organic ion imaging beyond the limit of static secondary ion mass spectrometry. J Am Soc Mass Spectrom 6: 1047-1058.
    • (1995) J Am Soc Mass Spectrom , vol.6 , pp. 1047-1058
    • McMahon, J.M.1    Dookeran, N.N.2    Todd, P.J.3
  • 52
    • 84890613168 scopus 로고    scopus 로고
    • Dynamic SIMS
    • Vickerman J.C., Gilmore I., editors., 2nd edition. Chichester: John Wiley & Sons
    • McPhail D, Dowsett. MG,. 2009. Dynamic SIMS. In:, Vickerman JC, Gilmore I, editors. Surface analysis: The principle techniques, 2nd edition. Chichester: John Wiley & Sons. pp 207-254.
    • (2009) Surface Analysis: The Principle Techniques , pp. 207-254
    • McPhail, D.1    Dowsett, M.G.2
  • 53
  • 54
    • 66149160254 scopus 로고    scopus 로고
    • Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams
    • Ninomiya S, Ichiki K, Yamada H, Nakata Y, Seki T, Aoki T, Matsuo J,. 2009. Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams. Rapid Commun Mass Spectrom 23: 1601-1606.
    • (2009) Rapid Commun Mass Spectrom , vol.23 , pp. 1601-1606
    • Ninomiya, S.1    Ichiki, K.2    Yamada, H.3    Nakata, Y.4    Seki, T.5    Aoki, T.6    Matsuo, J.7
  • 55
    • 28444482786 scopus 로고    scopus 로고
    • Localization of cholesterol, phosphocholine and galactosylceramide in rat cerebellar cortex with imaging TOF-SIMS equipped with a bismuth cluster ion source
    • Nygren H, Borner K, Hagenhoff B, Malmberg P, Mansson JE,. 2005. Localization of cholesterol, phosphocholine and galactosylceramide in rat cerebellar cortex with imaging TOF-SIMS equipped with a bismuth cluster ion source. Biochim Biophys Acta 1737: 102-110.
    • (2005) Biochim Biophys Acta , vol.1737 , pp. 102-110
    • Nygren, H.1    Borner, K.2    Hagenhoff, B.3    Malmberg, P.4    Mansson, J.E.5
  • 57
    • 0001534437 scopus 로고    scopus 로고
    • Imaging with mass spectrometry
    • Pacholski M, Winograd N,. 1999. Imaging with mass spectrometry. Chem Rev 99: 2977-3005.
    • (1999) Chem Rev , vol.99 , pp. 2977-3005
    • Pacholski, M.1    Winograd, N.2
  • 58
    • 61449141030 scopus 로고    scopus 로고
    • Salt effects on ion formation in desorption mass spectrometry: An investigation into the role of alkali chlorides on peak suppression in time-of-flight-secondary ion mass spectrometry
    • Piwowar AM, Lockyer NP, Vickerman JC,. 2009. Salt effects on ion formation in desorption mass spectrometry: An investigation into the role of alkali chlorides on peak suppression in time-of-flight-secondary ion mass spectrometry. Anal Chem 81: 1040-1048.
    • (2009) Anal Chem , vol.81 , pp. 1040-1048
    • Piwowar, A.M.1    Lockyer, N.P.2    Vickerman, J.C.3
  • 59
    • 0642303324 scopus 로고
    • Secondary ion emission from metal targets under carbon trifluoride ion $(3+)$ and oxygen ion $(2+)$ bombardment
    • Reuter W,. 1987. Secondary ion emission from metal targets under carbon trifluoride ion $(3+)$ and oxygen ion $(2+)$ bombardment. Anal Chem 59: 2081-2087.
    • (1987) Anal Chem , vol.59 , pp. 2081-2087
    • Reuter, W.1
  • 64
    • 3543012575 scopus 로고    scopus 로고
    • Mass spectrometric imaging of lipids in brain tissue
    • Sjövall P, Lausmaa J, Johansson B, Andersson M,. 2004. Mass spectrometric imaging of lipids in brain tissue. Anal Chem 76: 4271-4278.
    • (2004) Anal Chem , vol.76 , pp. 4271-4278
    • Sjövall, P.1    Lausmaa, J.2    Johansson, B.3    Andersson, M.4
  • 65
    • 33747194709 scopus 로고    scopus 로고
    • Localization of lipids in freeze-dried mouse brain sections by imaging TOF-SIMS
    • Sjövall P, Johansson B, Lausmaa J,. 2006. Localization of lipids in freeze-dried mouse brain sections by imaging TOF-SIMS. Appl Surf Sci 252: 6966-6974.
    • (2006) Appl Surf Sci , vol.252 , pp. 6966-6974
    • Sjövall, P.1    Johansson, B.2    Lausmaa, J.3
  • 67
    • 38949122726 scopus 로고    scopus 로고
    • Lipid mapping in human dystrophic muscle by cluster-time-of-flight secondary ion mass spectrometry imaging
    • Tahallah N, Brunelle A, De La Porte S, Laprévote O,. 2008. Lipid mapping in human dystrophic muscle by cluster-time-of-flight secondary ion mass spectrometry imaging. J Lipid Res 49: 438-454.
    • (2008) J Lipid Res , vol.49 , pp. 438-454
    • Tahallah, N.1    Brunelle, A.2    De La Porte, S.3    Laprévote, O.4
  • 68
    • 0009031833 scopus 로고
    • Effect of the conductivity of the electrosprayed solution on the electrospray current. Factors determining analyte sensitivity in electrospray mass spectrometry
    • Tang L, Kebarle P,. 1991. Effect of the conductivity of the electrosprayed solution on the electrospray current. Factors determining analyte sensitivity in electrospray mass spectrometry. Anal Chem 63: 2709.
    • (1991) Anal Chem , vol.63 , pp. 2709
    • Tang, L.1    Kebarle, P.2
  • 71
    • 25144498383 scopus 로고    scopus 로고
    • Improvement of biological time-of-flight secondary ion mass spectrometry imaging with a bismuth cluster ion source
    • Touboul D, Kollmer F, Niehuis E, Brunelle A, Laprevote O,. 2005a. Improvement of biological time-of-flight secondary ion mass spectrometry imaging with a bismuth cluster ion source. J Am Soc Mass Spectrom 16: 1608.
    • (2005) J Am Soc Mass Spectrom , vol.16 , pp. 1608
    • Touboul, D.1    Kollmer, F.2    Niehuis, E.3    Brunelle, A.4    Laprevote, O.5
  • 72
    • 24644459876 scopus 로고    scopus 로고
    • Lipid imaging by gold cluster time-of-flight secondary ion mass spectrometry: Application to Duchenne muscular dystrophy
    • DOI 10.1194/jlr.M500058-JLR200
    • Touboul D, Brunelle A, Halgand F, De La Porte S, Laprévote O,. 2005b. Lipid imaging by gold cluster time-of-flight secondary ion mass spectrometry: Application to Duchenne muscular dystrophy. J Lipid Res 46: 1388-1395. (Pubitemid 43109802)
    • (2005) Journal of Lipid Research , vol.46 , Issue.7 , pp. 1388-1395
    • Touboul, D.1    Brunelle, A.2    Halgand, F.3    De La Porte, S.4    Laprevote, O.5
  • 74
    • 0030478835 scopus 로고    scopus 로고
    • A comparison of desorption yields from C-60(+) to atomic and polyatomic projectiles at keV energies
    • Van Stipdonk MJ, Harris RD, Schweikert EA,. 1996. A comparison of desorption yields from C-60(+) to atomic and polyatomic projectiles at keV energies. Rapid Commun Mass Spectrom 10: 1987-1991.
    • (1996) Rapid Commun Mass Spectrom , vol.10 , pp. 1987-1991
    • Van Stipdonk, M.J.1    Harris, R.D.2    Schweikert, E.A.3
  • 75
    • 0141765263 scopus 로고    scopus 로고
    • ToF-SIMS-An overview
    • Vickerman J.C., Briggs D., editors. Chichester: IM Publications. pp.
    • Vickerman JC,. 2001. ToF-SIMS-An overview. In:, Vickerman JC, Briggs D, editors. ToF-SIMS: Surface analysis by mass spectrometry. Chichester: IM Publications. pp 1-40.
    • (2001) ToF-SIMS: Surface Analysis by Mass Spectrometry , pp. 1-40
    • Vickerman, J.C.1
  • 76
    • 78650708805 scopus 로고    scopus 로고
    • Molecular Surface Mass Spectrometry by SIMS
    • In:. Vickerman J.C., Gilmore I., editors., 2nd edition. Chichester: John Wiley & Sons.
    • Vickerman JC,. 2009. In: Molecular Surface Mass Spectrometry by SIMS., Vickerman JC, Gilmore I, editors. Surface analysis: The principle techniques, 2nd edition. Chichester: John Wiley & Sons.
    • (2009) Surface Analysis: The Principle Techniques
    • Vickerman, J.C.1
  • 77
    • 13244258478 scopus 로고    scopus 로고
    • Molecular depth profiling of multilayer polymer films using time-of-flight secondary ion mass spectrometry
    • Wagner MS,. 2005. Molecular depth profiling of multilayer polymer films using time-of-flight secondary ion mass spectrometry. Anal Chem 77: 911.
    • (2005) Anal Chem , vol.77 , pp. 911
    • Wagner, M.S.1
  • 80
    • 0000719185 scopus 로고
    • Damage processes in molecular ion sputtering from solid and liquid targets
    • Benninghoven A., editor. Chichester, UK: John Wiley.
    • Williams P, Gillen G,. 1989. Damage processes in molecular ion sputtering from solid and liquid targets. In:, Benninghoven A, editor. Ion Formation from Organic Solids, IFOS IV. Chichester, UK: John Wiley. 15-21.
    • (1989) Ion Formation from Organic Solids, IFOS IV , pp. 15-21
    • Williams, P.1    Gillen, G.2
  • 81
    • 58149394840 scopus 로고    scopus 로고
    • Strong-field ionization of sputtered molecules for biomolecular imaging
    • Willingham D, Kucher A, Winograd N,. 2009. Strong-field ionization of sputtered molecules for biomolecular imaging. Chem Phys Lett 468: 264-269.
    • (2009) Chem Phys Lett , vol.468 , pp. 264-269
    • Willingham, D.1    Kucher, A.2    Winograd, N.3
  • 82
    • 0000499876 scopus 로고
    • Secondary-ion emission from silicon bombarded with atomic and molecular noble-gas ions
    • Wittmaack K,. 1979. Secondary-ion emission from silicon bombarded with atomic and molecular noble-gas ions. Surf Sci 90: 557-563.
    • (1979) Surf Sci , vol.90 , pp. 557-563
    • Wittmaack, K.1
  • 85
    • 10644272773 scopus 로고    scopus 로고
    • Molecular depth-profiling of histamine in ice using a buckminsterfullerene probe
    • Wucher A, Sun S, Szakal C, Winograd N,. 2004b. Molecular depth-profiling of histamine in ice using a buckminsterfullerene probe. Anal Chem 76: 7234-7242.
    • (2004) Anal Chem , vol.76 , pp. 7234-7242
    • Wucher, A.1    Sun, S.2    Szakal, C.3    Winograd, N.4
  • 86
    • 33747199330 scopus 로고    scopus 로고
    • Molecular secondary ion formation under cluster bombardment: A fundamental review
    • Wucher A,. 2006. Molecular secondary ion formation under cluster bombardment: A fundamental review. Appl Surf Sci 252: 6482-6489.
    • (2006) Appl Surf Sci , vol.252 , pp. 6482-6489
    • Wucher, A.1
  • 87
    • 34547725082 scopus 로고    scopus 로고
    • Protocols for three-dimensional molecular imaging using mass spectrometry
    • Wucher A, Cheng J, Winograd N,. 2007. Protocols for three-dimensional molecular imaging using mass spectrometry. Anal Chem 79: 5529-5539.
    • (2007) Anal Chem , vol.79 , pp. 5529-5539
    • Wucher, A.1    Cheng, J.2    Winograd, N.3
  • 88
    • 56749180193 scopus 로고    scopus 로고
    • A simple erosion dynamics model of molecular sputter depth profiling
    • Wucher A,. 2008. A simple erosion dynamics model of molecular sputter depth profiling. Surf Interface Anal 40: 1545-1551.
    • (2008) Surf Interface Anal , vol.40 , pp. 1545-1551
    • Wucher, A.1
  • 90
    • 0021468872 scopus 로고
    • Consequences of sputtering with molecular ions
    • Zalm CP, Beckers LJ,. 1984. Consequences of sputtering with molecular ions. J Appl Phys 56: 220.
    • (1984) J Appl Phys , vol.56 , pp. 220
    • Zalm, C.P.1    Beckers, L.J.2
  • 91
    • 11544375741 scopus 로고    scopus 로고
    • Ion formation in MALDI mass spectrometry
    • Zenobi R, Knochenmuss R,. 1998. Ion formation in MALDI mass spectrometry. Mass Spectrom Rev 17: 337-366.
    • (1998) Mass Spectrom Rev , vol.17 , pp. 337-366
    • Zenobi, R.1    Knochenmuss, R.2
  • 92
    • 38149128188 scopus 로고    scopus 로고
    • Chemically alternating Langmuir-Blodgett thin films as a model for molecular depth profiling by mass spectrometry
    • Zheng L, Wucher A, Winograd N,. 2008. Chemically alternating Langmuir-Blodgett thin films as a model for molecular depth profiling by mass spectrometry. J Am Soc Mass Spectrom 19: 96.
    • (2008) J Am Soc Mass Spectrom , vol.19 , pp. 96
    • Zheng, L.1    Wucher, A.2    Winograd, N.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.