Characterisation of thin film chalcogenide PV materials using MeV ion beam analysis

1st International Conference on Sustainable Power Generation and Supply, SUPERGEN '09

Volumn , Issue , 2009, Pages

  Jeynes, Chris ^a   Zoppi, Guillaume ^b   Forbes, Ian ^b   Bailey, Melanie J ^a   Peng, Nianhua ^a  

^a UNIVERSITY OF SURREY   (United Kingdom)

^b NORTHUMBRIA UNIVERSITY   (United Kingdom)

Author keywords

Ion beam applications; Materials science and technology; Photovoltaic cell materials; Semiconductor films; Thin film devices

Indexed keywords

CHARACTERISATION; COMPOUND SEMICONDUCTORS; ION BEAM ANALYSIS; ION-BEAM APPLICATIONS; MATERIALS SCIENCE AND TECHNOLOGY; METALLIC PRECURSOR; NOVEL MATERIALS; PARTICLE INDUCED X-RAY EMISSION; PHOTOVOLTAIC CELL MATERIALS; PHOTOVOLTAIC SYSTEMS; RUTHERFORD BACK-SCATTERING; SELF-CONSISTENT TREATMENT; SEMICONDUCTOR FILMS; TECHNICAL CHALLENGES; THIN-FILM TECHNOLOGY;

CHARACTERIZATION; COPPER COMPOUNDS; DEPTH PROFILING; ION BEAMS; IONS; PHOTOELECTROCHEMICAL CELLS; PHOTOVOLTAIC CELLS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTOR DEVICES; THIN FILM DEVICES; THIN FILMS;

MATERIALS;

EID: 77951458508     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SUPERGEN.2009.5348162     Document Type: Conference Paper

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