Elemental X-ray imaging using the Maia detector array: The benefits and challenges of large solid-angle

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 619, Issue 1-3, 2010, Pages 37-43

  Ryan, C G ^a,d,e   Kirkham, R ^a   Hougha, R M ^a   Moorhead, G ^a,d   Siddons, D P ^b   De Jonge, M D ^c   Patersone, D J ^c   De Geronimod, G ^b   Howarde, D L ^c   Cleverley, J S ^a  

^a CSIRO   (Australia)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

^c AUSTRALIAN SYNCHROTRON   (Australia)

^d UNIVERSITY OF MELBOURNE   (Australia)

^e UNIVERSITY OF TASMANIA   (Australia)

Author keywords

Dynamic analysis; Fundamental parameter method; PIXE; Silicon detector; SXRF; Trace element imaging; X ray microprobe

Indexed keywords

APPLICATION PROGRAMS; DYNAMIC ANALYSIS; SILICON DETECTORS; TRACE ELEMENTS;

DETECTOR SENSITIVITY; DYNAMIC ANALYSIS METHOD; FUNDAMENTAL PARAMETER METHOD; GEOLOGICAL APPLICATIONS; IMAGING APPLICATIONS; MICRO-PROBES; PIXE; SXRF;

SOFTWARE PROTOTYPING;

EID: 78650300180     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2009.11.035     Document Type: Conference Paper

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