Characterisation of gunshot residue particles using self-consistent ion beam analysis

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 267, Issue 12-13, 2009, Pages 2265-2268

  Bailey, M J ^a   Jeynes, C ^a  

^a UNIVERSITY OF SURREY   (United Kingdom)

Author keywords

EBS; Gunshot residue; PIXE; RBS; Simulated annealing

Indexed keywords

BACKSCATTERING SPECTROMETRY; CHARACTERISATION; CONVENTIONAL METHODS; EBS; GUNSHOT RESIDUE; INDIVIDUAL PARTICLES; ION BEAM ANALYSIS; PARTICLE INDUCED X-RAY EMISSION; PARTICLE SPECTRA; PIXE; RBS; SELF-CONSISTENCY; SPHERICAL PARTICLE; TRACE ELEMENT COMPOSITION;

BACKSCATTERING; CHEMICAL ANALYSIS; EMISSION SPECTROSCOPY; ION BEAMS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; TRACE ELEMENTS;

SIMULATED ANNEALING;

EID: 66349112222     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2009.03.031     Document Type: Article

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