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Volumn 260, Issue 1, 2007, Pages 8-14
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A survey of two-stage focusing systems for nanobeam design
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Author keywords
Microbeam; Nanobeam; Spherical aberration
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Indexed keywords
ABERRATIONS;
ELECTRON LENSES;
MICROMETERS;
PARAMETER ESTIMATION;
PRODUCT DESIGN;
RAY TRACING;
SOFTWARE PACKAGES;
DEMAGNIFICATION;
MICROBEAMS;
NANOBEAMS;
SPHERICAL ABERRATION;
PROBES;
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EID: 34249871612
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nimb.2007.01.272 Document Type: Article |
Times cited : (18)
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References (6)
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