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Volumn 260, Issue 1, 2007, Pages 8-14

A survey of two-stage focusing systems for nanobeam design

Author keywords

Microbeam; Nanobeam; Spherical aberration

Indexed keywords

ABERRATIONS; ELECTRON LENSES; MICROMETERS; PARAMETER ESTIMATION; PRODUCT DESIGN; RAY TRACING; SOFTWARE PACKAGES;

EID: 34249871612     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2007.01.272     Document Type: Article
Times cited : (18)

References (6)
  • 6
    • 34249897591 scopus 로고    scopus 로고
    • G.W. Grime, TRAX software, 1982.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.