Bayesian error analysis of Rutherford backscattering spectra

Thin Solid Films

Volumn 343-344, Issue 1-2, 1999, Pages 31-34

  Barradas, N P ^a   Jeynes, C ^a   Jenkin, M ^a   Marriott, P K ^a  

^a UNIVERSITY OF SURREY   (United Kingdom)

Author keywords

Bayesian inference; Ion beam analysis; Markov chain Monte Carlo; Rutherford backscattering

Indexed keywords

ALGORITHMS; ERROR ANALYSIS; ION BEAMS; MARKOV PROCESSES; MONTE CARLO METHODS; SPECTROMETRY; STATISTICAL METHODS; THIN FILMS;

BAYESIAN ERROR ANALYSIS; BAYESIAN INFERENCE; ION BEAM ANALYSIS;

RUTHERFORD BACKSCATTERING SPECTROSCOPY;

EID: 0032623782     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)01681-2     Document Type: Article

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