Limited angle STIM and PIXE tomography of single cells

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 268, Issue 11-12, 2010, Pages 1884-1888

  Andrea, T ^a   Rothermel, M ^a   Werner, R ^a   Butz, T ^a   Reinert, T ^a  

^a UNIVERSITY OF LEIPZIG   (Germany)

Author keywords

PIXE; STIM; Tomography

Indexed keywords

ANGULAR RANGE; DIMENSIONAL CHARACTERIZATION; ELEMENTAL CONCENTRATIONS; ELEMENTAL DISTRIBUTION; ENERGY LOSS; FILTERED BACK-PROJECTION; HIGH DEMAND; INTERIOR STRUCTURE; INTRACELLULAR STRUCTURES; LIMITED-ANGLE TOMOGRAPHY; MICROSAMPLES; PARTICLE INDUCED X-RAY EMISSION; PHOSPHORUS DISTRIBUTION; PIXE; REAL-SPACE; SAMPLE PREPARATION TECHNIQUES; SCANNING TRANSMISSION ION MICROSCOPY; SINGLE CELLS;

ENERGY DISSIPATION; ION BEAMS; PHOSPHORUS; SCANNING ELECTRON MICROSCOPY; THREE DIMENSIONAL;

TOMOGRAPHY;

EID: 77953133000     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2010.02.049     Document Type: Article

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