Atomic Force Microscopy of Polymers: Imaging, Probing and Lithography

Macromolecular Engineering: Precise Synthesis, Materials Properties, Applications

Volumn 3, Issue , 2011, Pages 1515-1574

  Sheiko, Sergei S ^a   Moller, Martin ^b  

^a University of North Carolina at Chapel Hill   (United States)

^b RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

Atomic force microscopy; Imaging; Lithography; Measuring properties; Polymer morphologies; Polymers; Probing

Indexed keywords

EID: 84857507959     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9783527631421.ch36     Document Type: Chapter

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