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Atomic-scale and microscale friction of graphite and diamond using friction force microscopy
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J. Ruan, and B. Bhushan Atomic-scale and microscale friction of graphite and diamond using friction force microscopy J. Appl. Phys. 76 1994 5022 5035
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Frictional behavior of highly oriented pyrolytic graphite
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J. Ruan, and B. Bhushan Frictional behavior of highly oriented pyrolytic graphite J. Appl. Phys. 76 1994 8117 8120
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Ruan, J.1
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3-TiC, polycrystalline and single-crystal Mn-Zn ferrite and SiC head slider materials
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Friction force microscopy of mixed Langmuir-Blodgett films
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Functional group imaging by chemical force microscopy
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Atomic-scale friction measurements using friction force microscopy: Part II. Application to magnetic media
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B. Bhushan, and J. Ruan Atomic-scale friction measurements using friction force microscopy Part II. application to magnetic media ASME J. Trib. 116 1994 389 396
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Effect of scan size and surface roughness on microscale friction measurements
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Topography-induced contributions to friction forces measured using an atomic force/friction force microscope
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B. Bhushan, and G.S. Blackman Atomic force microscopy of magnetic rigid disks and sliders and its applications to tribology ASME J. Tribol. 113 1991 452 458
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Bhushan, B.1
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Micro/nanoscale friction and wear mechanisms of thin films using atomic force and friction force microscopy
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B. Bhushan, and S. Sundararajan Micro/nanoscale friction and wear mechanisms of thin films using atomic force and friction force microscopy Acta Mater. 46 1998 3793 3804
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Thin-film friction and adhesion studies using atomic force microscopy
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B. Bhushan, and C. Dandavate Thin-film friction and adhesion studies using atomic force microscopy J. Appl. Phys. 87 2000 1201 1210
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30
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0034668528
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Theoretical investigation of the distance dependence of capillary and van der Waals forces in scanning probe microscopy
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T. Stifter, O. Marti, and B. Bhushan Theoretical investigation of the distance dependence of capillary and van der Waals forces in scanning probe microscopy Phys. Rev. B 62 2000 13667 13673
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Ruan, J.1
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0039352172
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Nanoindentation hardness measurements using atomic force microscopy
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B. Bhushan, and V.N. Koinkar Nanoindentation hardness measurements using atomic force microscopy Appl. Phys. Lett. 64 1994 1653 1655
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Nano/picoindentation measurement using a capacitance transducer system in atomic force microscopy
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B. Bhushan, A.V. Kulkarni, W. Bonin, and J.T. Wyrobek Nano/picoindentation measurement using a capacitance transducer system in atomic force microscopy Philos. Mag. 74 1996 1117 1128
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Bhushan, B.1
Kulkarni, A.V.2
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Effect of normal load on microscale friction measurements
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B. Bhushan, and A.V. Kulkarni Effect of normal load on microscale friction measurements Thin Solid Films 278 1996 49 56 293 and 333
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Thin Solid Films
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Bhushan, B.1
Kulkarni, A.V.2
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0035262037
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Development of a continuous microscratch technique in an atomic force microscope and its application to study scratch resistance of ultra-thin hard amorphous carbon coatings
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S. Sundararajan, and B. Bhushan Development of a continuous microscratch technique in an atomic force microscope and its application to study scratch resistance of ultra-thin hard amorphous carbon coatings J. Mater. Res. 16 2001 75 84
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J. Mater. Res.
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Sundararajan, S.1
Bhushan, B.2
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0031332581
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Scanning and transmission electron microscopies of single-crystal silicon microworn/machined using atomic force microscopy
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V.N. Koinkar, and B. Bhushan Scanning and transmission electron microscopies of single-crystal silicon microworn/machined using atomic force microscopy J. Mater. Res. 12 1997 3219 3224
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J. Mater. Res.
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Koinkar, V.N.1
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0032461278
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Material removal mechanism of single-crystal silicon on nanoscale and at ultra-low loads
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X. Zhao, and B. Bhushan Material removal mechanism of single-crystal silicon on nanoscale and at ultra-low loads Wear 223 1998 66 78
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Wear
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Zhao, X.1
Bhushan, B.2
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38
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0001415506
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Use of a nanoscale Kelvin probe for detecting wear precursors
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D. DeVecchio, and B. Bhushan Use of a nanoscale Kelvin probe for detecting wear precursors Rev. Sci. Instrum. 69 1998 3618 3624
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(1998)
Rev. Sci. Instrum.
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Devecchio, D.1
Bhushan, B.2
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39
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0033742838
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Measurements and analysis of surface potential change during wear of single-crystal silicon (1 0 0) at ultra-low loads using Kelvin probe microscopy
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B. Bhushan, and A.V. Goldade Measurements and analysis of surface potential change during wear of single-crystal silicon (1 0 0) at ultra-low loads using Kelvin probe microscopy Appl. Surf. Sci. 157 2000 373 381
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Appl. Surf. Sci.
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Bhushan, B.1
Goldade, A.V.2
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40
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0034281625
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Kelvin probe microscopy measurements of surface potential change under wear at low loads
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B. Bhushan, and A.V. Goldade Kelvin probe microscopy measurements of surface potential change under wear at low loads Wear 244 2000 104 117
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Wear
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Bhushan, B.1
Goldade, A.V.2
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0035097390
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Atomic force microscopic study of the micro-cracking of magnetic thin films under tension
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M.S. Bobji, and B. Bhushan Atomic force microscopic study of the micro-cracking of magnetic thin films under tension Scripta Mater. 44 2001 37 42
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Scripta Mater.
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Bobji, M.S.1
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0035295258
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In situ microscopic surface characterization studies of polymeric thin films during tensile deformation using atomic force microscopy
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M.S. Bobji, and B. Bhushan In situ microscopic surface characterization studies of polymeric thin films during tensile deformation using atomic force microscopy J. Mater. Res. 16 2001 844 855
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J. Mater. Res.
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Bobji, M.S.1
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0037327234
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A new technique to measure Poisson's ratio of ultrathin polymeric films using atomic force microscopy
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B. Bhushan, P.S. Mokashi, and T. Ma A new technique to measure Poisson's ratio of ultrathin polymeric films using atomic force microscopy Rev. Sci. Instrum. 74 2003 1043 1047
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Rev. Sci. Instrum.
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Bhushan, B.1
Mokashi, P.S.2
Ma, T.3
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44
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0000659906
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Tribological studies of silicon for magnetic recording applications
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B. Bhushan, and V.N. Koinkar Tribological studies of silicon for magnetic recording applications J. Appl. Phys. 75 1994 5741 5746
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Bhushan, B.1
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Nanoscale mechanical property measurements using modified atomic force microscopy
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A.V. Kulkarni, and B. Bhushan Nanoscale mechanical property measurements using modified atomic force microscopy Thin Solid Films 290/291 1996 206 210
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0030380920
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Nano/picoindentation measurements on single-crystal aluminum using modified atomic force microscopy
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A.V. Kulkarni, and B. Bhushan Nano/picoindentation measurements on single-crystal aluminum using modified atomic force microscopy Mater. Lett. 29 1996 221 227
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A.V. Kulkarni, and B. Bhushan Nanoindentation measurement of amorphous carbon coatings J. Mater. Res. 12 1997 2707 2714
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0027797526
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Nanoindentation studies of fullerene films using atomic force microscopy
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J. Ruan, and B. Bhushan Nanoindentation studies of fullerene films using atomic force microscopy J. Mater. Res. 8 1993 3019 3022
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Ruan, J.1
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0031367324
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Localized surface elasticity measurements using an atomic force microscope
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D. DeVecchio, and B. Bhushan Localized surface elasticity measurements using an atomic force microscope Rev. Sci. Instrum. 68 1997 4498 4505
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Devecchio, D.1
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0038542116
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Use of phase imaging in atomic force microscopy for measurement of viscoelastic contrast in polymer nanocomposites and molecularly thick lubricant films
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W.W. Scott, and B. Bhushan Use of phase imaging in atomic force microscopy for measurement of viscoelastic contrast in polymer nanocomposites and molecularly thick lubricant films Ultramicroscopy 97 2003 151 169
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0041321379
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Phase contrast imaging on nanocomposites and molecularly thick lubricant films in magnetic media
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B. Bhushan, and J. Qi Phase contrast imaging on nanocomposites and molecularly thick lubricant films in magnetic media Nanotechnology 14 2003 886 895
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Micro/nanoscale studies of boundary layers of liquid lubricants for magnetic disks
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V.N. Koinkar, and B. Bhushan Micro/nanoscale studies of boundary layers of liquid lubricants for magnetic disks J. Appl. Phys. 79 1996 8071 8075
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V.N. Koinkar, and B. Bhushan Microtribological studies of unlubricated and lubricated surfaces using atomic force/friction force microscopy J. Vac. Sci. Technol. A 14 1996 2378 2391
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Nanotribological characterization of molecularly thick lubricant films for applications to MEMS/NEMS by AFM
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33745482231
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Microtribological characterization of self-assembled and Langmuir-Blodgett monolayers by atomic and friction force microscopy
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0034909993
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Nanotribological properties and mechanisms of alkylthiol and biphenyl thiol self-assembled monolayers studied by AFM
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B. Bhushan, and H. Liu Nanotribological properties and mechanisms of alkylthiol and biphenyl thiol self-assembled monolayers studied by AFM Phys. Rev. B 63 2001 245412-1-245412-11
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Investigation of the adhesion, friction, and wear properties of biphenyl thiol self-assembled monolayers by atomic force microscopy
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H. Liu, and B. Bhushan Investigation of the adhesion, friction, and wear properties of biphenyl thiol self-assembled monolayers by atomic force microscopy J. Vac. Sci. Technol. A 19 2001 1234 1240
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Investigation of nanotribological properties of self-assembled monolayers with alkyl and biphenyl spacer chains
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H. Liu, and B. Bhushan Investigation of nanotribological properties of self-assembled monolayers with alkyl and biphenyl spacer chains Ultramicroscopy 91 2002 185 202
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Self-assembled monolayers for controlling hydrophobicity and/or friction and wear
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B. Bhushan CRC Press Boca Raton, Florida
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B. Bhushan Self-assembled monolayers for controlling hydrophobicity and/or friction and wear B. Bhushan Modern Tribology Handbook, Materials, Coatings, and Industrial Applications vol. 2 2001 CRC Press Boca Raton, Florida 909 929
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(2001)
Modern Tribology Handbook, Materials, Coatings, and Industrial Applications
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Bhushan, B.1
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