메뉴 건너뛰기




Volumn 259, Issue 7-12, 2005, Pages 1507-1531

Nanotribology and nanomechanics

Author keywords

Atomic force microscopy; Friction; Lubrication; Mechanical properties; Nanomechanics; Nanotribology; Wear

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTATIONAL COMPLEXITY; COMPUTER SIMULATION; INDENTATION; LUBRICATION; MAGNETIC STORAGE; PROBES; SCANNING TUNNELING MICROSCOPY; THIN FILMS;

EID: 19844377748     PISSN: 00431648     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.wear.2005.01.010     Document Type: Article
Times cited : (237)

References (62)
  • 5
    • 0033500121 scopus 로고    scopus 로고
    • Nanoscale tribophysics and tribomechanics
    • B. Bhushan Nanoscale tribophysics and tribomechanics Wear 225-229 1999 465 492
    • (1999) Wear , vol.225-229 , pp. 465-492
    • Bhushan, B.1
  • 6
    • 0032671732 scopus 로고    scopus 로고
    • Wear and mechanical characterisation on micro- to picoscales using AFM
    • B. Bhushan Wear and mechanical characterisation on micro- to picoscales using AFM Int. Mat. Rev. 44 1999 105 117
    • (1999) Int. Mat. Rev. , vol.44 , pp. 105-117
    • Bhushan, B.1
  • 8
    • 0003317614 scopus 로고    scopus 로고
    • Fundamentals of Tribology and Bridging the Gap between the Macro- and Micro/Nanoscales
    • Kluwer Academic Pub. Dordrecht, Netherlands
    • B. Bhushan Fundamentals of Tribology and Bridging the Gap Between the Macro- and Micro/Nanoscales NATO Science Series II vol. 10 2001 Kluwer Academic Pub. Dordrecht, Netherlands
    • (2001) NATO Science Series II , vol.10
    • Bhushan, B.1
  • 9
    • 0035482578 scopus 로고    scopus 로고
    • Nano- to microscale wear and mechanical characterization studies using scanning probe microscopy
    • B. Bhushan Nano- to microscale wear and mechanical characterization studies using scanning probe microscopy Wear 251 2001 1105 1123
    • (2001) Wear , vol.251 , pp. 1105-1123
    • Bhushan, B.1
  • 11
    • 0029292717 scopus 로고
    • Nanotribology: Friction, wear and lubrication at the atomic-scale
    • B. Bhushan, J.N. Israelachvili, and U. Landman Nanotribology: friction, wear and lubrication at the atomic-scale Nature 374 1995 607 616
    • (1995) Nature , vol.374 , pp. 607-616
    • Bhushan, B.1    Israelachvili, J.N.2    Landman, U.3
  • 16
    • 0000054630 scopus 로고
    • Atomic-scale and microscale friction of graphite and diamond using friction force microscopy
    • J. Ruan, and B. Bhushan Atomic-scale and microscale friction of graphite and diamond using friction force microscopy J. Appl. Phys. 76 1994 5022 5035
    • (1994) J. Appl. Phys. , vol.76 , pp. 5022-5035
    • Ruan, J.1    Bhushan, B.2
  • 17
    • 0001383288 scopus 로고
    • Frictional behavior of highly oriented pyrolytic graphite
    • J. Ruan, and B. Bhushan Frictional behavior of highly oriented pyrolytic graphite J. Appl. Phys. 76 1994 8117 8120
    • (1994) J. Appl. Phys. , vol.76 , pp. 8117-8120
    • Ruan, J.1    Bhushan, B.2
  • 18
    • 0030430312 scopus 로고    scopus 로고
    • 3-TiC, polycrystalline and single-crystal Mn-Zn ferrite and SiC head slider materials
    • 3-TiC, polycrystalline and single-crystal Mn-Zn ferrite and SiC head slider materials Wear 202 1996 110 122
    • (1996) Wear , vol.202 , pp. 110-122
    • Koinkar, V.N.1    Bhushan, B.2
  • 21
    • 0027974489 scopus 로고
    • Atomic-scale friction measurements using friction force microscopy: Part II. Application to magnetic media
    • B. Bhushan, and J. Ruan Atomic-scale friction measurements using friction force microscopy Part II. application to magnetic media ASME J. Trib. 116 1994 389 396
    • (1994) ASME J. Trib. , vol.116 , pp. 389-396
    • Bhushan, B.1    Ruan, J.2
  • 23
    • 0029266021 scopus 로고
    • Micro/nanotribology and its applications to magnetic storage devices and MEMS
    • B. Bhushan Micro/nanotribology and its applications to magnetic storage devices and MEMS Tribol. Int. 28 1995 85 95
    • (1995) Tribol. Int. , vol.28 , pp. 85-95
    • Bhushan, B.1
  • 24
    • 0001492267 scopus 로고    scopus 로고
    • Effect of scan size and surface roughness on microscale friction measurements
    • V.N. Koinkar, and B. Bhushan Effect of scan size and surface roughness on microscale friction measurements J. Appl. Phys. 81 1997 2472 2479
    • (1997) J. Appl. Phys. , vol.81 , pp. 2472-2479
    • Koinkar, V.N.1    Bhushan, B.2
  • 25
    • 0000411452 scopus 로고    scopus 로고
    • Topography-induced contributions to friction forces measured using an atomic force/friction force microscope
    • S. Sundararajan, and B. Bhushan Topography-induced contributions to friction forces measured using an atomic force/friction force microscope J. Appl. Phys. 88 2000 4825 4831
    • (2000) J. Appl. Phys. , vol.88 , pp. 4825-4831
    • Sundararajan, S.1    Bhushan, B.2
  • 27
    • 0026187096 scopus 로고
    • Atomic force microscopy of magnetic rigid disks and sliders and its applications to tribology
    • B. Bhushan, and G.S. Blackman Atomic force microscopy of magnetic rigid disks and sliders and its applications to tribology ASME J. Tribol. 113 1991 452 458
    • (1991) ASME J. Tribol. , vol.113 , pp. 452-458
    • Bhushan, B.1    Blackman, G.S.2
  • 28
    • 0000146123 scopus 로고    scopus 로고
    • Micro/nanoscale friction and wear mechanisms of thin films using atomic force and friction force microscopy
    • B. Bhushan, and S. Sundararajan Micro/nanoscale friction and wear mechanisms of thin films using atomic force and friction force microscopy Acta Mater. 46 1998 3793 3804
    • (1998) Acta Mater. , vol.46 , pp. 3793-3804
    • Bhushan, B.1    Sundararajan, S.2
  • 29
    • 0000404672 scopus 로고    scopus 로고
    • Thin-film friction and adhesion studies using atomic force microscopy
    • B. Bhushan, and C. Dandavate Thin-film friction and adhesion studies using atomic force microscopy J. Appl. Phys. 87 2000 1201 1210
    • (2000) J. Appl. Phys. , vol.87 , pp. 1201-1210
    • Bhushan, B.1    Dandavate, C.2
  • 30
    • 0034668528 scopus 로고    scopus 로고
    • Theoretical investigation of the distance dependence of capillary and van der Waals forces in scanning probe microscopy
    • T. Stifter, O. Marti, and B. Bhushan Theoretical investigation of the distance dependence of capillary and van der Waals forces in scanning probe microscopy Phys. Rev. B 62 2000 13667 13673
    • (2000) Phys. Rev. B , vol.62 , pp. 13667-13673
    • Stifter, T.1    Marti, O.2    Bhushan, B.3
  • 31
    • 0027947140 scopus 로고
    • Atomic-scale friction measurements using friction force microscopy: Part I. General principles and new measurement techniques
    • J. Ruan, and B. Bhushan Atomic-scale friction measurements using friction force microscopy Part I. General principles and new measurement techniques ASME J. Tribol. 116 1994 378 388
    • (1994) ASME J. Tribol. , vol.116 , pp. 378-388
    • Ruan, J.1    Bhushan, B.2
  • 32
    • 0039352172 scopus 로고
    • Nanoindentation hardness measurements using atomic force microscopy
    • B. Bhushan, and V.N. Koinkar Nanoindentation hardness measurements using atomic force microscopy Appl. Phys. Lett. 64 1994 1653 1655
    • (1994) Appl. Phys. Lett. , vol.64 , pp. 1653-1655
    • Bhushan, B.1    Koinkar, V.N.2
  • 33
    • 0030293526 scopus 로고    scopus 로고
    • Nano/picoindentation measurement using a capacitance transducer system in atomic force microscopy
    • B. Bhushan, A.V. Kulkarni, W. Bonin, and J.T. Wyrobek Nano/picoindentation measurement using a capacitance transducer system in atomic force microscopy Philos. Mag. 74 1996 1117 1128
    • (1996) Philos. Mag. , vol.74 , pp. 1117-1128
    • Bhushan, B.1    Kulkarni, A.V.2    Bonin, W.3    Wyrobek, J.T.4
  • 34
    • 0030146539 scopus 로고    scopus 로고
    • Effect of normal load on microscale friction measurements
    • B. Bhushan, and A.V. Kulkarni Effect of normal load on microscale friction measurements Thin Solid Films 278 1996 49 56 293 and 333
    • (1996) Thin Solid Films , vol.278 , pp. 49-56
    • Bhushan, B.1    Kulkarni, A.V.2
  • 35
    • 0035262037 scopus 로고    scopus 로고
    • Development of a continuous microscratch technique in an atomic force microscope and its application to study scratch resistance of ultra-thin hard amorphous carbon coatings
    • S. Sundararajan, and B. Bhushan Development of a continuous microscratch technique in an atomic force microscope and its application to study scratch resistance of ultra-thin hard amorphous carbon coatings J. Mater. Res. 16 2001 75 84
    • (2001) J. Mater. Res. , vol.16 , pp. 75-84
    • Sundararajan, S.1    Bhushan, B.2
  • 36
    • 0031332581 scopus 로고    scopus 로고
    • Scanning and transmission electron microscopies of single-crystal silicon microworn/machined using atomic force microscopy
    • V.N. Koinkar, and B. Bhushan Scanning and transmission electron microscopies of single-crystal silicon microworn/machined using atomic force microscopy J. Mater. Res. 12 1997 3219 3224
    • (1997) J. Mater. Res. , vol.12 , pp. 3219-3224
    • Koinkar, V.N.1    Bhushan, B.2
  • 37
    • 0032461278 scopus 로고    scopus 로고
    • Material removal mechanism of single-crystal silicon on nanoscale and at ultra-low loads
    • X. Zhao, and B. Bhushan Material removal mechanism of single-crystal silicon on nanoscale and at ultra-low loads Wear 223 1998 66 78
    • (1998) Wear , vol.223 , pp. 66-78
    • Zhao, X.1    Bhushan, B.2
  • 38
    • 0001415506 scopus 로고    scopus 로고
    • Use of a nanoscale Kelvin probe for detecting wear precursors
    • D. DeVecchio, and B. Bhushan Use of a nanoscale Kelvin probe for detecting wear precursors Rev. Sci. Instrum. 69 1998 3618 3624
    • (1998) Rev. Sci. Instrum. , vol.69 , pp. 3618-3624
    • Devecchio, D.1    Bhushan, B.2
  • 39
    • 0033742838 scopus 로고    scopus 로고
    • Measurements and analysis of surface potential change during wear of single-crystal silicon (1 0 0) at ultra-low loads using Kelvin probe microscopy
    • B. Bhushan, and A.V. Goldade Measurements and analysis of surface potential change during wear of single-crystal silicon (1 0 0) at ultra-low loads using Kelvin probe microscopy Appl. Surf. Sci. 157 2000 373 381
    • (2000) Appl. Surf. Sci. , vol.157 , pp. 373-381
    • Bhushan, B.1    Goldade, A.V.2
  • 40
    • 0034281625 scopus 로고    scopus 로고
    • Kelvin probe microscopy measurements of surface potential change under wear at low loads
    • B. Bhushan, and A.V. Goldade Kelvin probe microscopy measurements of surface potential change under wear at low loads Wear 244 2000 104 117
    • (2000) Wear , vol.244 , pp. 104-117
    • Bhushan, B.1    Goldade, A.V.2
  • 41
    • 0035097390 scopus 로고    scopus 로고
    • Atomic force microscopic study of the micro-cracking of magnetic thin films under tension
    • M.S. Bobji, and B. Bhushan Atomic force microscopic study of the micro-cracking of magnetic thin films under tension Scripta Mater. 44 2001 37 42
    • (2001) Scripta Mater. , vol.44 , pp. 37-42
    • Bobji, M.S.1    Bhushan, B.2
  • 42
    • 0035295258 scopus 로고    scopus 로고
    • In situ microscopic surface characterization studies of polymeric thin films during tensile deformation using atomic force microscopy
    • M.S. Bobji, and B. Bhushan In situ microscopic surface characterization studies of polymeric thin films during tensile deformation using atomic force microscopy J. Mater. Res. 16 2001 844 855
    • (2001) J. Mater. Res. , vol.16 , pp. 844-855
    • Bobji, M.S.1    Bhushan, B.2
  • 43
    • 0037327234 scopus 로고    scopus 로고
    • A new technique to measure Poisson's ratio of ultrathin polymeric films using atomic force microscopy
    • B. Bhushan, P.S. Mokashi, and T. Ma A new technique to measure Poisson's ratio of ultrathin polymeric films using atomic force microscopy Rev. Sci. Instrum. 74 2003 1043 1047
    • (2003) Rev. Sci. Instrum. , vol.74 , pp. 1043-1047
    • Bhushan, B.1    Mokashi, P.S.2    Ma, T.3
  • 44
    • 0000659906 scopus 로고
    • Tribological studies of silicon for magnetic recording applications
    • B. Bhushan, and V.N. Koinkar Tribological studies of silicon for magnetic recording applications J. Appl. Phys. 75 1994 5741 5746
    • (1994) J. Appl. Phys. , vol.75 , pp. 5741-5746
    • Bhushan, B.1    Koinkar, V.N.2
  • 45
    • 0030386759 scopus 로고    scopus 로고
    • Nanoscale mechanical property measurements using modified atomic force microscopy
    • A.V. Kulkarni, and B. Bhushan Nanoscale mechanical property measurements using modified atomic force microscopy Thin Solid Films 290/291 1996 206 210
    • (1996) Thin Solid Films , vol.290-291 , pp. 206-210
    • Kulkarni, A.V.1    Bhushan, B.2
  • 46
    • 0030380920 scopus 로고    scopus 로고
    • Nano/picoindentation measurements on single-crystal aluminum using modified atomic force microscopy
    • A.V. Kulkarni, and B. Bhushan Nano/picoindentation measurements on single-crystal aluminum using modified atomic force microscopy Mater. Lett. 29 1996 221 227
    • (1996) Mater. Lett. , vol.29 , pp. 221-227
    • Kulkarni, A.V.1    Bhushan, B.2
  • 47
    • 0031248629 scopus 로고    scopus 로고
    • Nanoindentation measurement of amorphous carbon coatings
    • A.V. Kulkarni, and B. Bhushan Nanoindentation measurement of amorphous carbon coatings J. Mater. Res. 12 1997 2707 2714
    • (1997) J. Mater. Res. , vol.12 , pp. 2707-2714
    • Kulkarni, A.V.1    Bhushan, B.2
  • 48
    • 0027797526 scopus 로고
    • Nanoindentation studies of fullerene films using atomic force microscopy
    • J. Ruan, and B. Bhushan Nanoindentation studies of fullerene films using atomic force microscopy J. Mater. Res. 8 1993 3019 3022
    • (1993) J. Mater. Res. , vol.8 , pp. 3019-3022
    • Ruan, J.1    Bhushan, B.2
  • 51
    • 0031367324 scopus 로고    scopus 로고
    • Localized surface elasticity measurements using an atomic force microscope
    • D. DeVecchio, and B. Bhushan Localized surface elasticity measurements using an atomic force microscope Rev. Sci. Instrum. 68 1997 4498 4505
    • (1997) Rev. Sci. Instrum. , vol.68 , pp. 4498-4505
    • Devecchio, D.1    Bhushan, B.2
  • 52
    • 0038542116 scopus 로고    scopus 로고
    • Use of phase imaging in atomic force microscopy for measurement of viscoelastic contrast in polymer nanocomposites and molecularly thick lubricant films
    • W.W. Scott, and B. Bhushan Use of phase imaging in atomic force microscopy for measurement of viscoelastic contrast in polymer nanocomposites and molecularly thick lubricant films Ultramicroscopy 97 2003 151 169
    • (2003) Ultramicroscopy , vol.97 , pp. 151-169
    • Scott, W.W.1    Bhushan, B.2
  • 53
    • 0041321379 scopus 로고    scopus 로고
    • Phase contrast imaging on nanocomposites and molecularly thick lubricant films in magnetic media
    • B. Bhushan, and J. Qi Phase contrast imaging on nanocomposites and molecularly thick lubricant films in magnetic media Nanotechnology 14 2003 886 895
    • (2003) Nanotechnology , vol.14 , pp. 886-895
    • Bhushan, B.1    Qi, J.2
  • 55
    • 0000988792 scopus 로고    scopus 로고
    • Micro/nanoscale studies of boundary layers of liquid lubricants for magnetic disks
    • V.N. Koinkar, and B. Bhushan Micro/nanoscale studies of boundary layers of liquid lubricants for magnetic disks J. Appl. Phys. 79 1996 8071 8075
    • (1996) J. Appl. Phys. , vol.79 , pp. 8071-8075
    • Koinkar, V.N.1    Bhushan, B.2
  • 56
    • 0030480544 scopus 로고    scopus 로고
    • Microtribological studies of unlubricated and lubricated surfaces using atomic force/friction force microscopy
    • V.N. Koinkar, and B. Bhushan Microtribological studies of unlubricated and lubricated surfaces using atomic force/friction force microscopy J. Vac. Sci. Technol. A 14 1996 2378 2391
    • (1996) J. Vac. Sci. Technol. a , vol.14 , pp. 2378-2391
    • Koinkar, V.N.1    Bhushan, B.2
  • 57
    • 0037709895 scopus 로고    scopus 로고
    • Nanotribological characterization of molecularly thick lubricant films for applications to MEMS/NEMS by AFM
    • H. Liu, and B. Bhushan Nanotribological characterization of molecularly thick lubricant films for applications to MEMS/NEMS by AFM Ultramicroscopy 97 2003 321 340
    • (2003) Ultramicroscopy , vol.97 , pp. 321-340
    • Liu, H.1    Bhushan, B.2
  • 58
    • 33745482231 scopus 로고
    • Microtribological characterization of self-assembled and Langmuir-Blodgett monolayers by atomic and friction force microscopy
    • B. Bhushan, A.V. Kulkarni, V.N. Koinkar, M. Boehm, L. Odoni, C. Martelet, and M. Belin Microtribological characterization of self-assembled and Langmuir-Blodgett monolayers by atomic and friction force microscopy Langmuir 11 1995 3189 3198
    • (1995) Langmuir , vol.11 , pp. 3189-3198
    • Bhushan, B.1    Kulkarni, A.V.2    Koinkar, V.N.3    Boehm, M.4    Odoni, L.5    Martelet, C.6    Belin, M.7
  • 59
    • 0034909993 scopus 로고    scopus 로고
    • Nanotribological properties and mechanisms of alkylthiol and biphenyl thiol self-assembled monolayers studied by AFM
    • B. Bhushan, and H. Liu Nanotribological properties and mechanisms of alkylthiol and biphenyl thiol self-assembled monolayers studied by AFM Phys. Rev. B 63 2001 245412-1-245412-11
    • (2001) Phys. Rev. B , vol.63
    • Bhushan, B.1    Liu, H.2
  • 60
    • 0035394340 scopus 로고    scopus 로고
    • Investigation of the adhesion, friction, and wear properties of biphenyl thiol self-assembled monolayers by atomic force microscopy
    • H. Liu, and B. Bhushan Investigation of the adhesion, friction, and wear properties of biphenyl thiol self-assembled monolayers by atomic force microscopy J. Vac. Sci. Technol. A 19 2001 1234 1240
    • (2001) J. Vac. Sci. Technol. a , vol.19 , pp. 1234-1240
    • Liu, H.1    Bhushan, B.2
  • 61
    • 0036326337 scopus 로고    scopus 로고
    • Investigation of nanotribological properties of self-assembled monolayers with alkyl and biphenyl spacer chains
    • H. Liu, and B. Bhushan Investigation of nanotribological properties of self-assembled monolayers with alkyl and biphenyl spacer chains Ultramicroscopy 91 2002 185 202
    • (2002) Ultramicroscopy , vol.91 , pp. 185-202
    • Liu, H.1    Bhushan, B.2
  • 62
    • 85046490398 scopus 로고    scopus 로고
    • Self-assembled monolayers for controlling hydrophobicity and/or friction and wear
    • B. Bhushan CRC Press Boca Raton, Florida
    • B. Bhushan Self-assembled monolayers for controlling hydrophobicity and/or friction and wear B. Bhushan Modern Tribology Handbook, Materials, Coatings, and Industrial Applications vol. 2 2001 CRC Press Boca Raton, Florida 909 929
    • (2001) Modern Tribology Handbook, Materials, Coatings, and Industrial Applications , vol.2 , pp. 909-929
    • Bhushan, B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.