A mechanical microscope: High-speed atomic force microscopy

Applied Physics Letters

Volumn 86, Issue 3, 2005, Pages 1-3

  Humphris, A D L ^a   Miles, M J ^a   Hobbs, J K ^a,b  

^a UNIVERSITY OF BRISTOL   (United Kingdom)

^b UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BANDWIDTH; CANTILEVER BEAMS; CRYSTALLINE MATERIALS; FEEDBACK; FREQUENCY RESPONSE; IMAGE ANALYSIS; POLYMERS; RESONATORS;

GLASS CUBES; MACROMOLECULAR PROCESSES; MICROCANTILEVERS; MICRORESONATORS;

ATOMIC FORCE MICROSCOPY;

EID: 17044388175     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1855407     Document Type: Article

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