A study of topographic effects on chemical force microscopy using adhesive force mapping

Ultramicroscopy

Volumn 97, Issue 1-4, 2003, Pages 303-314

  Sato, Fuminobu ^a   Okui, Hiroki ^a   Akiba, Uichi ^a   Suga, Kosaku ^a   Fujihira, Masamichi ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Adhesive forces; Microcontact printing; Pulsed force mode atomic force microscopy; Self assembled monolayer

Indexed keywords

ATOMIC FORCE MICROSCOPY; GOLD; GRAIN SIZE AND SHAPE; HIGH TEMPERATURE EFFECTS; SPUTTERING;

ADHESIVE FORCES;

FORCE MEASUREMENT;

GOLD; WATER;

ADHESION; ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL FORCE MICROSCOPY; CHEMICAL MODIFICATION; FILM; HISTOGRAM; SAMPLING; SURFACE PROPERTY; TECHNIQUE; TOPOGRAPHY; VACUUM; VAPOR;

EID: 0038517766     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(03)00056-1     Document Type: Article

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