A method for determining the spring constant of cantilevers for atomic force microscopy

Measurement Science and Technology

Volumn 7, Issue 2, 1996, Pages 179-184

  Torii, Akihiro ^a   Sasaki, Minoru ^b   Hane, Kazuhiro ^c   Okuma, Shigeru ^b  

^a AICHI INSTITUTE OF TECHNOLOGY   (Japan)

^b NAGOYA UNIVERSITY   (Japan)

^c TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001026801     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/7/2/010     Document Type: Article

References (17)

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16. Micro cantilevers catalog, (silicon nitride, V-sharpened, pyramidal tip) (Tokyo: Olympus)
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