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Volumn 44, Issue 20, 2003, Pages 6345-6352

A comparison of atomic force microscope friction and phase imaging for the characterization of an immiscible polystyrene/poly(methyl methacrylate) blend film

Author keywords

Atomic force microscope; Compositional mapping; Polymer film

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; COMPOSITION; FRICTION; PLASTIC FILMS; SOLUBILITY;

EID: 0041693763     PISSN: 00323861     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0032-3861(03)00611-6     Document Type: Article
Times cited : (29)

References (16)
  • 2
    • 0002436330 scopus 로고
    • Atomic force microscopy of polymer films
    • Goh MC. Atomic force microscopy of polymer films. Advances in chemical physics, 91; 1995. p. 1-83.
    • (1995) Advances in Chemical Physics , vol.91 , pp. 1-83
    • Goh, M.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.