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Volumn 125, Issue 16, 2003, Pages 4907-4917

Conformational change in an isolated single synthetic polymer chain on a mica surface observed by atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BENZENE; CONFORMATIONS; DEPOSITION; MICA; POLYMETHYL METHACRYLATES; POLYSTYRENES;

EID: 0242600582     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja0290429     Document Type: Article
Times cited : (124)

References (39)
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    • The precise measurement of the particle diameter is difficult due to the finite tip size effect in AFM measurement. We discuss our aproach to overcome this difficulty in section 3.2.
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    • note
    • We think this expansion of the surface area in the monolayer during the deposition process occurs only at the deposition from a dilute state or a low surface pressure. The area should be reduced and kept constant at the deposition from a compressed film, such as shown in Figure 3.
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