Calibration of rectangular atomic force microscope cantilevers

Review of Scientific Instruments

Volumn 70, Issue 10, 1999, Pages 3967-3969

  Sader, John E ^a   Chon, James W M ^a   Mulvaney, Paul ^a  

^a UNIVERSITY OF MELBOURNE   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001155528     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1150021     Document Type: Article

References (20)

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15. The cantilevers were vibrating at their base using the Tapping Mode cantilever tune software in the Nanoscope III atomic force microscope (Digital Instruments, USA).
16. To establish the ultimate lower limit for L/b, for which the method is applicable, measurements need to be performed on cantilevers with aspect ratios smaller than those used in this study.
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