High-speed tapping mode imaging with active Q control for atomic force microscopy

Applied Physics Letters

Volumn 76, Issue 11, 2000, Pages 1473-1475

  Sulchek, T ^d   Hsieh, R ^d   Adams, J D ^d   Yaralioglu, G G ^d   Minne, S C ^d   Quate, C F ^d   Cleveland, J P ^a   Atalar, A ^b   Adderton, D M ^c  

^a United States   (United States)

^b BILKENT UNIVERSITY   (Turkey)

^c Nanodevices Inc   (United States)

^d NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042328491     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126071     Document Type: Article

References (18)

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