Study of elastic modulus and yield strength of polymer thin films using atomic force microscopy

Langmuir

Volumn 17, Issue 11, 2001, Pages 3286-3291

  Du, Binyang ^a   Tsui, Ophelia K C ^b   Zhang, Qingling ^a   He, Tianbai ^a  

^a CHANGCHUN INSTITUTE OF APPLIED CHEMISTRY   (China)

^b HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

POLYMER THIN FILMS;

ATOMIC FORCE MICROSCOPY; ELASTIC MODULI; INDENTATION; POLYCARBONATES; POLYSTYRENES; THIN FILMS; YIELD STRESS;

PLASTIC FILMS;

EID: 0035967657     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la001434a     Document Type: Article

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