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Volumn 99, Issue 13, 2002, Pages 8473-8478
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Inverting dynamic force microscopy: From signals to time-resolved interaction forces
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Author keywords
[No Author keywords available]
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Indexed keywords
ARTICLE;
ATOMIC FORCE MICROSCOPY;
COVALENT BOND;
MOLECULAR DYNAMICS;
PRIORITY JOURNAL;
SIGNAL PROCESSING;
SURFACE PROPERTY;
MICROSCOPY, ATOMIC FORCE;
SURFACE PROPERTIES;
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EID: 0037172996
PISSN: 00278424
EISSN: None
Source Type: Journal
DOI: 10.1073/pnas.122040599 Document Type: Article |
Times cited : (195)
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References (38)
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