Direct Measurement of Surface Diffusion Using Atom-Tracking Scanning Tunneling Microscopy

Physical Review Letters

Volumn 76, Issue 3, 1996, Pages 459-462

  Swartzentruber, B S ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3342985165     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.76.459     Document Type: Article

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