Study of the polydispersity of grafted poly(dimethylsiloxane) surfaces using single-molecule atomic force microscopy

Journal of Physical Chemistry B

Volumn 105, Issue 18, 2001, Pages 3965-3971

  Al Maawali, Sabah ^a   Bemis, Jason E ^a   Akhremitchev, Boris B ^a   Leecharoen, Rojana ^a   Janesko, Benjamin G ^a   Walker, Gilbert C ^a  

^a UNIVERSITY OF PITTSBURGH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT ANGLE MEASUREMENT; GRAFTED POLYDIMETHYLSILOXANE; POLYDISPERSITY INDEX; SINGLE-MOLECULE ATOMIC FORCE MICROSCOPY;

ANGLE MEASUREMENT; ATOMIC FORCE MICROSCOPY; CALCULATIONS; CHEMICAL BONDS; ELLIPSOMETRY; GEL PERMEATION CHROMATOGRAPHY; GRAFT COPOLYMERS; MATHEMATICAL MODELS; MOLECULAR WEIGHT; MONOLAYERS; PROBABILITY DISTRIBUTIONS;

SURFACE CHEMISTRY;

EID: 0035837980     PISSN: 10895647     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp0037246     Document Type: Article

References (42)

1. Fleer, G. J.; Stuart, M. A. C.; Scheutjens, J. M. H. M.; Cisgrove, T.; Vincent, B. Polymers at Interfaces; Chapman & Hall: London, New York, 1993.
2. Stuart, M. A. C.; Scheutjens, J. M. H. M.; Fleer, G. J. J. Polym. Sci. 1980, 18, 559.
3. Fleer, G. J.; Scheutjens, J. M. H. M.; Stuart, M. A. C. Colloids Surf. 1988, 31, 1.
4. Cooper, A. R. Determination of Molecular weight; John Wiley and Sons; New York, 1989; Chapter 10.
5. Dobias, B. Coagulation and Flocculation, Theory and Applications; Marcel Dekker: New York 1993.
6. Bustamante, C. Science 1994, 265, 1599.
7. Ikai, A. Surf. Sci. Rep. 1996, 26, 261.
8. Ortiz, C.; Hadziioannou, G. Macromolecules 1999, 32, 780.
9. Li, H.; Rief, M.; Oesterhelt, F.; Gaub, H. Adv. Mater. 1998, 3, 316.
10. (a) Rief, M.; Fernandez J. M.; Gaub, H. Phys. Rev. Lett. 1998, 81, 4764.
11. (b) Florin, E. L.; Moy. V. T.; Gaub, H. E. Science 1994, 264, 415.
12. (a) Li, H.; Liu, B.; Zhang, X.; Gao, C.; Shen, J.; Zou, G. Langmuir 1999, 15, 2120.
13. (b) Yamamoto, S.; Tsujii, Y.; Fukuda, T. Macromolecules 2000, 33, 5995-5998.
14. Bemis, J. E.; Akhremitchev, B. B.; Walker, G. C. Langmuir 1999, 15, 2799.
15. Clarson, S. J.; Semlyen, J. A. Siloxane Polymers; Prentice Hall: Englewood Cliffs, NJ, 1993.
16. Luo, H.; Chidsey, C. E. D. Appl. Phys. Lett. 1998, 72, 477.
17. Linford, M. R.; Fenter, P.; Eisenberger, P. M.; Chidsey, C. E. D. J. Am. Chem. Soc. 1995, 117, 3145.
18. Wade, C. P,; Chidsey, C. E. D. Appl. Phys. Lett. 1997, 71, 1679.
19. Higashi, G. S.; Becker, R. S.; Chabal, Y. J.; Becker, A. J. Appl. Phys. Lett. 1991, 58, 1656.
20. Allongue, P.; Kielling, V.; Gerisher, H. G. Electrochim. Acta 1995. 40. 1353.
21. Le Grange, J. D.; Markham, J. L.; Kurkjian, C. R. Langmuir 1993, 9, 1749.
22. Bouchacina, T.; Michel, D.; Aime, J. P.; Gauthier, S. J. Appl. Phys. 1997, 82, 3652.
23. Rubinsztajn, S.; Cypryk, M.; Chojnowski, J. J. Organomet. Chem. 1989, 367, 27.
24. Israelachvili, J. Intermolecular and Surface Forces, 2nd ed.; Academic Press: New York, 1991.
25. Azzam, R. M. A.; Bashara, N. M. Ellipsometry and Polarized Light; North-Holland Publishing Co.: Amsterdam 1977.
26. Wasserman, S. R.; Whitesides, G. M.; Tidswell, I. M.; Ocko, B. M.; Pershan, P. S.; Axe, J. D. J. Am. Chem. Soc. 1989, 111, 5852.
27. Tompkins, H. G. A User's Guide to ELLIPSOMETRY; Academic Press: New York, 1993.
28. Wenzler, L. A.; Moyes, G. L.; Olson, L. G.; Harris, J. M.; Beebe, T. P., Jr. Anal. Chem. 1997, 69, 285.
29. Brandrup, J.; Immergut, E. H. Polymer Handbook; Wiley: New York, 1989; Vol. VII/464.
30. De Gennes, P. G. J. Chim. Phys. (Paris) 1976, 37, 1443.
31. w0 is the segment molecular weight.
32. Alexander, S. J. Chim. Phys. (Paris) 1977, 38, 983.
33. Haupt, B. J.; Ennis, J.; Sevick, E. M. Langmuir 1999, 15, 3886.
34. (a) Plory, P. J. Statistical Mechanics of Chain Molecules; Hanser Publishers: Cincinnati, 1988.
35. (b) Flory, J. Principles of Polymer Chemistry; Cornell University Press: Ithaca, NY, 1995.
36. Sendon, T. J.; di Meglio, J.-M.; Auroy, P. Eur. Phys. J. B 1998, 36, 211.
37. Note: Effect of cleaning the AFM silicon tip by argon plasma etching. After the AFM silicon tips were cleaned for 2 min using argon plasma, the rupture forces were observed to increase from 0.62 nN observed earlier in Figure 5 to 1.2 nN. Ghatak et al. (Ghatak, A.; Vorvolakos, She, K. H.; Malotky, D. L.; Chaudhury, M. K. J. Phys. Chem. B 2000, 104, 4018) also observed this effect.
38. Nguyen. Q.; Kausch, H. H. Colloid Polym. Sci. 1991, 269, 1099.
39. Kausch, H. H. Polymer Fracture, 2nd ed.; Springer-Verlag: Berlin, New York, 1987.
40. Atkins, P. W. Physical Chemistry, 4th ed.; W. H. Freeman and Co.: New York, 1990.
41. ea.
42. i is the experimentally observed probability of an adhesion jump off of defpletion i. The reasoning for the above equation is that if at a given length half the time there is an adhesion jump obscuring the detection of polymer stretching, then the probability of a polymer stretching event should be twice as high as we detect at that distance.