Short cantilevers for atomic force microscopy

Review of Scientific Instruments

Volumn 67, Issue 10, 1996, Pages 3583-3590

  Walters, D A ^a   Cleveland, J P ^a   Thomson, N H ^a   Hansma, P K ^a   Wendman, M A ^b   Gurley, G ^b   Elings, V ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b Digital Instruments   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000368409     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1147177     Document Type: Article

References (50)

1. G. Binnig, C. F. Quate, and C. Gerber , Phys. Rev. Lett. 56, 930 (1986).
2. D. Rugar and P. K. Hansma, Phys. Today 43, 23 (1990).
3. Q. Zhong, D. Inniss, K. Kjoller, and V. B. Elings, Surf. Sci. Lett. 290, L888 (1993).
4. D. Anselmetti, R. Luthi, E. Meyer, T. Richmond, M. Dreier, J. E. Frommer, and H. J. Guntherodt, Nanotechnology 5, 87 (1994).
5. P. K. Hansma, J. P. Cleveland, M. Radmacher, D. A. Walters, P. Hillner, M. Bezanilla, M. Fritz, D. Vie, H. G. Hansma, C. B. Prater, J. Massie, L. Fukunaga, J. Gurley, and V. Elings, Appl. Phys. Lett. 64, 1738 (1994).
6. M. Dreier, D. Anselmetti, T. Richmond, U. Dammer, and H. J. Guntherodt, J. Appl. Phys. 76, 5095 (1994).
7. C. A. J. Putman, K. O. Van der Werf, B. G. De Grooth, N. F. Van Hulst, and J. Greve, Appl. Phys. Lett. 64, 2454 (1994).
8. M. A. Lantz, S. J. O'Shea, and M. E. Weiland, Appl. Phys. Lett. 65, 409 (1994).
9. J. P. Spatz, S. Sheiko, M. Moller, R. G. Winkler, P. Reineker, and O. Marti, Nanotechnology 6, 40 (1995).
10. D. Sarid, J. Chen, and R. K. Workman, Comput. Mater. Sci. 3, 475 (1995).
11. J. Chen, R. K. Workman, D. Sarid, and R. Hoper, Nanotechnology 5, 199 (1994).
12. M. Radmacher, R. W. Tillmann, and H. E. Gaub, Biophys. J. 64, 735 (1993).
13. N. A. Burnham, A. J. Kulik, G. Gremaud, P.-J. Gallo, and F. Oulevey, J. Vac. Sci. Technol. B 14, 794 (1995).
14. T. C. Reiley, L. S. Fan, and H. J. Mamin, Microelectron. Eng. 27, 495 (1995).
15. N. Garcia and V. T. Binh, Phys. Rev. B 46, 7946 (1992).
16. N. Garcia, A. P. Levanyuk, S. A. Minyukov, and V. T. Binh, Surf. Sci. 328, 337 (1995).
17. V. T. Binh, N. Garcia, and A. L. Levanyuk, Surf. Sci. 301, L224 (1994).
18. M. G. L. Gustafsson and J. Clarke, J. Appl. Phys. 76, 172 (1994).
19. T. R. Albrecht, S. Akamine, T. E. Carver, and C. F. Quate, J. Vac. Sci. Technol. A 8, 3386 (1990).
20. M. Sekimoto, H. Yoshihara, and T. Ohkubo, J. Vac. Sci. Technol. 21, 1017 (1982).
21. S. Akamine and C. F. Quate, J. Vac. Sci. Technol. B 10, 2307 (1992).
22. Nanoscope III, Digital Instruments, Santa Barbara, CA.
23. Model 113, Princeton Applied Research, Princeton, NJ.
24. MacAdios II, GW Instruments, Somerville, MA.
25. N. P. D'Costa and J. H. Hoh, Rev. Sci. Instrum. 66, 5096 (1995).
26. D. Sarid, Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces, 2nd ed. (Oxford University Press, New York, 1994).
27. H.-J. Butt and M. Jaschke, Nanotechnology 6, 1 (1995).
28. Sigma, St. Louis, MO.
29. Y. Akama, E. Nishimura, A. Sakai, and H. Murakami, J. Vac. Sci. Technol. A 8, 429 (1990).
30. D. J. Keller and C. C. Chou, Surf. Sci. 268, 333 (1992).
31. K. I. Schiffmann, Nanotechnology 4, 163 (1993).
32. J. E. Sader, I. Larson, P. Mulvaney, and L. R. White, Rev. Sci. Instrum. 66, 3789 (1995).
33. B. Abedian and M. Cundari, Proc. SPIE 1916, 454 (1993).
34. H. J. Butt, P. Siedle, K. Seifert, K. Fendler, T. Seeger, E. Bamberg, A. L. Weisenhorn, K. Goldie, and A. Engel, J. Microsc. 169, 75 (1993).
35. G. Y. Chen, R. J. Warmack, T. Thundat, D. P. Allison, and A. Huang, Rev. Sci. Instrum. 65, 2532 (1994).
36. J. P. Cleveland, S. Manne, D. Bocek, and P. K. Hansma, Rev. Sci. Instrum. 64, 403 (1993).
37. Shell Chemical Corp., Houston, TX.
38. J. L. Hutter and J. Bechhoefer, Rev. Sci. Instrum. 64, 1868 (1993).
39. dc, to relate the fit parameters to the mean square cantilever displacement. This should give the same spring constants as integrating the fit curve.
40. D. G. Crighton, J. Sound Vibration 87, 429 (1983).
41. D. G. Crighton and D. Innes, Philos. Trans. R. Soc. London, A 312, 295 (1984).
42. D. G. Crighton, J. Sound Vibration 133, 1 (1989).
43. U. S. Lindholm, D. D. Kana, W. Chu, and H. N. Abramson, J. Ship Res. 9, 11 (1965).
44. Y. Fu and W. G. Price, J. Sound Vibration 118, 495 (1987).
45. T. Terasawa, Y. Kawamura, K. Sato, and S. Tanaka, Bull. Jpn. Soc. Prec. Eng. 22, 49 (1988).
46. T. Tschan, N. de Rooij, and A. Bezinge, Sens. Actuators A 32, 375 (1992).
47. R. E. Hetrick, Sens. Actuators 18, 131 (1989).
48. G. Muthuveerappan, W. Ganeson, and M. A. Veluswami, J. Sound Vibration 61, 467 (1978).
49. L. D. Landau and E. M. Lifshitz, Fluid Mechanics, 2nd ed. (Pergamon, Oxford, England, 1987).
50. P. I. Oden, G. Y. Chen, R. A. Steele, R. J. Warmack, and T. Thundat, Appl. Phys. Lett. 68, 3814 (1996).