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Volumn 62, Issue 20, 2000, Pages 13680-13686
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Force interaction between a W tip and Si(111) investigated under ultrahigh vacuum conditions
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Author keywords
[No Author keywords available]
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Indexed keywords
TUNGSTEN;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
CALCULATION;
ELASTICITY;
ELECTRIC POTENTIAL;
FORCE;
INTERFEROMETER;
MOLECULAR DYNAMICS;
RIGIDITY;
SCANNING ELECTRON MICROSCOPY;
VACUUM;
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EID: 0034668530
PISSN: 01631829
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevB.62.13680 Document Type: Article |
Times cited : (7)
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References (30)
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