Nanotribological properties of unsymmetrical n-dialkyl sulfide monolayers on gold: Effect of chain length on adhesion, friction, and imaging

Langmuir

Volumn 16, Issue 7, 2000, Pages 3249-3256

  Van Der Vegte, Eric W ^a,c   Subbotin, Andrei ^a,d   Hadziioannou, Georges ^a   Ashton, Peter R ^b   Preece, Jon A ^b  

^a UNIVERSITY OF GRONINGEN   (Netherlands)

^b UNIVERSITY OF BIRMINGHAM   (United Kingdom)

^c DSM RESEARCH   (Netherlands)

^d TOPCHIEV INSTITUTE OF PETROCHEMICAL SYNTHESIS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; ANISOTROPY; FRICTION; GOLD; IMAGING TECHNIQUES; MOLECULAR STRUCTURE; NANOSTRUCTURED MATERIALS; SOLVENTS; SULFUR COMPOUNDS; TRIBOLOGY;

DIALKYL SULFIDE; FRICTION ANISOTROPY; FRICTION COEFFICIENT; MICROCONTACT PRINTING; NANOTRIBOLOGY;

MONOLAYERS;

EID: 0033890122     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la990911q     Document Type: Article

References (58)

1. (a) Xiao, X.-D.; Hu, J.; Charych, D. H.; Salmeron, M. Langmuir 1996, 12, 235.
2. (b) Gauthier, S.; Aimé, J. P.; Bouhacina, T.; Attias, A. J.; Desbat, B. Langmuir 1996, 12, 5126.
3. (c) Lio, A.; Charych, D. H.; Salmeron, M. J. Phys. Chem. B 1997, 101, 3800.
4. (a) McDermott, M. T.; Green, J.-B., D.; Porter, M. D. Langmuir 1997, 13, 2504.
5. (b) Lio, A.; Morant, C.; Ogletree, D. F.; Salmeron, M. J. Phys. Chem. B 1997, 101, 4767.
6. Liu, Y.; Wu, T.; Evans, D. F. Langmuir 1994, 10, 2241.
7. (b) Liu, Y.; Evans, D. F.; Song, Q.; Grainger, D. W. Langmuir 1996, 12, 1235.
8. Briscoe, B. J.; Evans, D. C. B. Proc. R. Soc. London A 1982, 380, 389.
9. (a) Bowden, F. P.; Tabor, D. The Friction and Lubrication of Solids; Clarendon Press: Oxford, 1986.
10. (b) Suzuki, M.; Saotome, Y.; Yanagisawa, M. Thin Solid Films 1988, 160, 453.
11. (b) Miyamoto, T.; Sato, I.; Ando, Y.; Tribology and Mechanics of Magnetic Storage Devices, 2nd ed.; Bushan, B., Eiss, N. S., Eds.; Springer-Verlag: New York, 1990.
12. (c) Bushan, B.; Gupta, B. K. Handbook of Tribology: Materials, Coatings and Surface Treatments; McGraw-Hill: New York, 1001.
13. For an overview see: Carpick, R. W.; Salmeron M. Chem. Rev. 1997, 97, 1163.
14. (a) van der Vegte, E. W.; Hadziioannou, G. Langmuir 1997, 13, 4357.
15. (b) van der Vegte, E. W.; Hadziioannou, G. J. Phys. Chem. 1997, 46, 9563.
16. See for example: (a) Troughton, E. B.; Bain, C. D.; Whitesides, G. M.; Nuzzo, R. G.; Allara, D. L.; Porter, M. D. Langmuir 1988, 4, 365.
17. (b) Steinberg, S.; Rubinstein, I. Langmuir 1992, 8, 1183.
18. (c) Hagenhoff, B.; Benninghoven, A.; Spinke, J.; Liley, M.; Knoll, W. Langmuir 1993, 9, 1622.
19. (d) Zhang, M.; Anderson, M. R. Langmuir 1994, 10, 2807.
20. (e) Zhong, C.-J.; Porter, M. D. J. Am. Chem. Soc. 1994, 116, 11616.
21. (f) Beulen, M. W. J., Huisman, B.-H.; van der Heijden, P. A.; van Veggel, F. C. J. M.; Simons, M.G.; Biemond, E. M. E. F.; de Lange, P. J.; Reinhoudt, D. N. Langmuir 1996, 12, 6170.
22. (a) Kumar, A.; Whitesides, G. M. Appl. Phys. Lett. 1993, 63, 2002.
23. (b) Kumar, A.; Biebuyck, H. A.; Whitesides, G. M. Langmuir 1993, 9, 1513.
24. (c) López, G.; Biebuyck, H. A.; Whitesides, G. M. Langmuir 1994, 10, 1513.
25. (d) Wilbur, J. L.; Kim, E.; Xia, Y.; Whitesides, G. M. Adv. Mater. 1995, 7, 649.
26. (e) Xia, Y.; Whitesides, G. M. Adv. Mater. 1995, 7, 471.
27. van der Mei, H. C.; Rosenberg, M.; Busscher, H. J. In Microbial Cell Surface Analysis; VCH Publishers: New York, 1991, 261.
28. Hutter, J. L.; Bechhoeffer, J. Rev. Sci. Instrum. 1993, 64, 1868.
29. (b) Hutter, J. L.; Bechhoeffer, J. Rev. Sci. Instrum. 1993, 64, 3342 (Erratum). We used the corrected method by Butt et al. which accounts for the spatial distribution of thermal energy along the entire length of the cantilever. Furthermore, a correction factor of √4/3 is required in the most common case of a rectangular beam cantilever. Butt, H.-J., Jaschke, M. Nanotechnology, 1995, 6, 1.
30. (b) Hutter, J. L.; Bechhoeffer, J. Rev. Sci. Instrum. 1993, 64, 3342 (Erratum). We used the corrected method by Butt et al. which accounts for the spatial distribution of thermal energy along the entire length of the cantilever. Furthermore, a correction factor of √4/3 is required in the most common case of a rectangular beam cantilever. Butt, H.-J., Jaschke, M. Nanotechnology, 1995, 6, 1.
31. Noy, A.; Frisbie, C. D.; Rozsnyai, L. F.; Wrighton, M. S.; Lieber, C. M. J. Am. Chem. Soc. 1995, 117, 7943.
32. Mate, C. M.; McClelland, G. M.; Elandsson, R.; Chiang, S. Phys. Rev. Lett. 1987, 59, 1942.
33. Koinkar, V. N.; Bushan, B. J. Appl. Phys. 1997, 81, 2572.
34. (a) Grandbois, M.; Beyer, M.; Rief, M.; Clausen-Schaumen, H.; Gaub, H. E. Science 1999, 283, 1727.
35. (b) Burnham, N. A.; Colton, R. J.; Pollock, H. M. Nanotechnology 1993, 4, 64.
36. (c) Weisenhorn, A. L.; Maiveld, P.; Butt, H.-J.; Hansma, P. K. Phys. Rev. B. 1992, 45, 11 226.
37. (a) Binggeli, M.; Mate, C. M. Appl. Phys. Lett. 1994, 65, 415.
38. (b) Grigg, D. A.; Russel, P. E.; Griffith, J. E. J. Vac. Sci. Technol. A 1992, 10, 680.
39. (c) Weisenhorn, A. L.; Hansma, P. K.; Albrecht, T. R.; Quate, C. F. Appl. Phys. Lett. 1989, 2651.
40. In practise it is difficult to compare different tips with each other, because they exhibit different tip-radii, which results in different contact areas and thus in a different number of interacting molecules contributing to the total adhesion force. It seems that the tip radii do not differ significantly in our measurements, since the adhesion forces of all five different tips on the 10/10 substrate are (almost) the same, whereas the adhesion forces of the 10/10 tip on the other substrates seem independent of the chain length (Figure 2). The adhesion force on the 10/10 substrate can be regarded as an internal reference for the adhesion measurements performed with the different tips.
41. (a) Barger, W.; Koleske, D.; Fledman, K.; Kruger, K.; Colton, R. Polym. Prep. 1996, 37, 606.
42. (b) Bar, G.; Rubin, S.; Parikh, A. N.; Swanson, B. I.; Zawodzinski, T. A., Jr.; Whangbo, M.-H. Langmuir 1997, 13, 373.
43. (a) Nakagawa, T.; Ogawa, K.; Kurumizawa, T.; Ozaki, S. Jpn. J. Appl. Phys. 1993, 32, 294.
44. (b) Nakagawa, T.; Ogawa, K.; Kurumizawa, T. J. Vac. Sci. Technol. B. 1994, 12, 2215.
45. lv denotes the liquid-vacuum interfacial energy. θ represents the contact angle between the liquid and the surface.
46. Horn, R. G.; Israelachvili, J. N.; Pribac, F. J. Colloid Interface Sci. 1986, 115, 480.
47. (a) Yoshizawa, H.; Chen, Y.-L.; Israelachvili, J. J. Phys. Chem. 1993, 97, 4128.
48. (b) Subbotini, A.; Ten Brinke, G.; Kulichikhin, V.; Hadziioannou, G. J. Chem. Phys. 1998, 109, 827.
49. (a) Subbotin, A.; Ten-Brinke, G.; Kulichikhin, V.; Hadziiannou, G. J. Chem. Phys. 1998, 109, 827.
50. (a) Green, J.-B. D.; McDermott, M. T.; Porter, M. D.; Siperko, L. M. J. Phys. Chem. 1995, 99, 10960.
51. (b) Tsukruk, V. V.; Everson, M. P.; Lander, L. M.; Brittain, W. J. Langmuir 1996, 12, 3905.
52. 21 Generally, one would expect non-Amonton's-law-like friction-load behavior in single asperity friction force measurements. The reason for the fact that Amonton's-law-like friction is often found in SFM measurements is believed to be the nanometer scale roughness of the tip, making it behave like a multi-asperity contact.
53. (a) Sinniah, S. K.; Steel, A. B.; Miller, J. C.; Reutt-Robey, J. E. J. Am. Chem. Soc. 1996, 118, 8925.
54. (b) Hutter, J. L.; Bechhoefer, J. J. Appl. Phys. 1993, 73, 4123.
55. Israelachvili, J. N. Intermolecular and Surface Forces; Academic Press: New York, 1992.
56. Chen, Y. L.; Helm, C.; Isrealachvili, J. N. J. Phys. Chem. 1991, 95, 10 736.
57. (a) Ludwig, M.; Dettman, W.; Gaub, H. E. Biophys. J. 1997, 72, 445.
58. (b) van der Werf, K. O.; Putman, C. A.; de Grooth, B. G.; Greve, J. Appl. Phys. Lett. 1994, 65, 1195.