Chemical force microscopy: Probing chemical origin of interfacial forces and adhesion

Journal of Adhesion Science and Technology

Volumn 19, Issue 3-5, 2005, Pages 313-364

  Vezenov, Dmitri V ^a   Noy, Aleksandr ^b   Ashby, Paul ^c  

^a HARVARD UNIVERSITY   (United States)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

Chemical force microscopy; Dynamic force spectroscopy; Force titrations; Self assembled monolayers

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; MATHEMATICAL MODELS; MICROSCOPIC EXAMINATION; MONOLAYERS; REACTION KINETICS; SELF ASSEMBLY; SILICON NITRIDE; SOLVENTS; THROUGHPUT; TITRATION; CHARACTERIZATION; FUNCTIONAL GROUPS; SELF ASSEMBLED MONOLAYERS;

CHEMICAL FORCE MICROSCOPY (CFM); CONDENSED PHASES; DYNAMIC FORCE SPECTROSCOPY (DFS); FORCE TITRATIONS;

MOLECULAR DYNAMICS; ADHESION;

ADHESION INTERACTIONS; ADHESION MEASUREMENT; CHEMICAL FORCE MICROSCOPY; CHEMICAL FUNCTIONALITY; CHEMICAL ORIGIN; CONDENSED PHASIS; DYNAMIC FORCE SPECTROSCOPY; FORCE TITRATIONS; HIGH-THROUGHPUT; INTERFACIAL FORCES; INTERMOLECULAR INTERACTIONS; INTERMOLECULAR POTENTIALS; MOLECULAR LEVELS; ORGANIC FUNCTIONAL GROUPS; PROBE TIPS; QUANTITATIVE CHARACTERIZATION; SOFT MATERIAL; SOLVATION EFFECT; THEORETICAL APPROACH;

EID: 22644434404     PISSN: 01694243     EISSN: None     Source Type: Journal    
DOI: 10.1163/1568561054352702     Document Type: Review

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