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Volumn 8, Issue 5, 2005, Pages 42-48
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Friction force microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC PHYSICS;
CANTILEVER BEAMS;
DAMPING;
ELASTICITY;
FRICTION;
MOLECULAR VIBRATIONS;
PLASTICITY;
SILICON NITRIDE;
STIFFNESS;
TORSIONAL STRESS;
TRIBOLOGY;
ATOMIC FRICTION;
FRICTION LAWS;
MICROFABRICATED CANTILEVERS;
THERMAL ACTIVATION;
MICROSCOPIC EXAMINATION;
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EID: 17644417113
PISSN: 13697021
EISSN: None
Source Type: Journal
DOI: 10.1016/S1369-7021(05)00845-X Document Type: Article |
Times cited : (43)
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References (36)
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