The colloidal probe technique and its application to adhesion force measurements

Particle and Particle Systems Characterization

Volumn 19, Issue 3, 2002, Pages 129-143

  Kappl, Michael ^a   Butt, Hans Jürgen ^a  

^a UNIVERSITY OF SIEGEN   (Germany)

Author keywords

Adhesion; Atomic force microscopy; Colloidal probe; Surface force

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; SENSORS; SURFACE PROPERTIES;

FORCE SENSORS; SURFACE FORCES;

COLLOIDS;

EID: 0036602287     PISSN: 09340866     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-4117(200207)19:3<129::AID-PPSC129>3.0.CO;2-G     Document Type: Review

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