Nanotribological properties of alkanephosphonic acid self-assembled monolayers on aluminum oxide: Effects of fluorination and substrate crystallinity

Langmuir

Volumn 22, Issue 9, 2006, Pages 3988-3998

  Brukman, Matthew J ^c,d   Marco, Gerard Oncins ^a   Dunbar, Timothy D ^b   Boardman, Larry D ^b   Carpick, Robert W ^c  

^a University of Wisconsin Madison   (United States)

^b UNIVERSITY OF BARCELONA   (Spain)

^c 3M COMPANY   (United States)

^d NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALKANEPHOSPHONIC ACID; NANOTRIBOLOGICAL PROPERTIES; PHOSPHONIC ACID; TOPOGRAPHIC IMAGING;

ADHESION; ALUMINUM COMPOUNDS; ATOMIC FORCE MICROSCOPY; CRYSTALLOGRAPHY; FLUORINE; HYDROGENATION; SILICON; SINGLE CRYSTALS; THIN FILMS;

MONOLAYERS;

EID: 33646435565     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la052847k     Document Type: Article

References (88)

1. Chaki, N. K.; Vijayamohanan, K. Biosens. Bioelectron. 2002, 17, 1-12.
2. Ashurst, W. R.; Yau, C.; Carraro, C.; Lee, C.; Kluth, G. J.; Howe, R. T.; Maboudian, R. Sens. Actuators. A 2001, 91). 239-248.
3. Friebel, S.; Aizenberg, J.; Abad, S.; Wiltzius, P. Appl. Phys. Lett. 2000, 77, 2406-2408.
4. Whelan, C. M.; Kinsella, M.; Carbonell, L.; Ho, H. M.; Maex, K.Microelectron. Eng. 2003, 70, 551-557.
5. Nuzzo, R. G.; Allara, D. L. J. Am. Chem. Soc. 1983, 105, 4481-4483.
6. Kiely, J. D.; Houston, J. E. Langmuir 1999, 15, 4513-4519.
7. Legrange, J. D.; Markham, J. L.; Kurkjian, C. R. Langmuir 1993, 9, 1749-1753.
8. Stevens, M. J. Langmuir 1999, 15, 2773-2778.
9. van Alsten, J. G. Langmuir 1999, 15, 7605-7614.
10. Pellerite, M. J.; Dunbar, T. D.; Boardman, L. D.; Wood, E. J. J. Phys. Chem. B 2003, 107, 11726-11736.
11. Gao, J. P.; Luedtke, W. D.; Gourdon, D.; Ruths, M.; Israelachvili, J. N.; Landman, U. J. Phys. Chem. B 2004, 108, 3410-3425.
12. Briscoe, B.; Evans, D. Proc. R. Soc. London, Ser. A 1982, 380), 389-407.
13. Chidsey, C. E. D.; Loiacono, D. N. Langmuir 1990, 6, 682-691.
14. Kim, H. I.; Koini, T.; Lee, T. R.; Perry, S. S. Langmuir 1997, 13, 7192-7196.
15. DePalma, V.; Tillman, N. Langmuir 1989, 5, 868.
16. Brandrup, J.; Immergut, E. H. Polymer Handbook, 2nd ed.; Wiley: New York, 1975.
17. Tamada, K.; Nagasawa, J.; Nakanishi, F.; Abe, K.; Hara, M.; Knoll, W.; Ishida, T.; Fukushima, H.; Miyashita, S.; Usui, T.; Koini, T.; Lee, T. R. Thin Solid Films 1998, 329, 150-155.
18. Gallaher, K. L.; Yokozeki, A.; Bauer, S. H. J. Phys. Chem. 1974, 78, 2389-2395.
19. Wolf, S. G.; Deutsch, M.; Landau, E. M.; Lahav, M.; Leiserowitz, L.; Kjaer, K.; Alsnielsen, J. Science 1988, 242, 1286-1290.
20. Naselli, C.; Swalen, J. D.; Rabolt, J. F. J. Chem. Phys. 1989, 90, 3855-3860.
21. Eaton, D. F.; Smart, B. E. J. Am. Chem. Soc. 1990, 112, 2821-2823.
22. Barton, S. W.; Goudot, A.; Bouloussa, O.; Rondelez, F.; Lin, B. H.; Novak, F.; Acero, A.; Rice, S. A. J. Chem. Phys. 1992, 96, 1343-1351.
23. Overney, R. M.; Meyer, E.; Frommer, J.; Brodbeck, D.; Lüthi, R.; Howald, L.; Güntherodt, H.-J.; Fujihara, M.; Takano, H.; Gotoh, Y. Nature 1992, 359 (6391), 133.
24. Chaudhury, M. K.; Owen, M. J. Langmuir 1993, 9, 29-31.
25. Guo, J.; Ellis, D.; Lam, D. Phys. Rev. B 1992, 45, 13647-13656.
26. Hongo, H.; Yudasaka, M.; Ichihashi, T.; Nihey, F.; Iijima, S. Chemical vapor deposition of single-wall carbon nanotubes on iron-film-coated sapphire substrates. Chem. Phys. Lett. 2002, 361, 349-354.
27. Guo, J.; Ellis, D. E.; Lam, D. J. Phys. Rev. B 1992, 45, 3204-3214.
28. Sader, J.; Chon, J.; Mulvaney, P. Rev. Sci. Instrum. 1999, 70, 3967-3969.
29. Varenberg, M.; Etsion, I.; Halperin, G. Rev. Sci. Instrum. 2003, 74, 3362-3367.
30. Ogletree, D.; Carpick, R.; Salmeron, M. Rev. Sci. Instrum. 1996, 67. 3298-3306.
31. The scripts are available for noncommercial use at http://mandm.engr. wisc.edu/faculty-pages_carpick/toolbox.htm.
32. Cannara, R. J.; Brukman, M. J.; Carpick, R. W. Rev. Sci. Instrum. 2005, 76, 53706-1-6.
33. Watson, G. S.; Dinte, B. P.; Blach-Watson, J. A.; Myhra, S. Appl. Surf. Sci. 2004, 235, 38-42.
34. Qian, L. M.; Xiao, X. D.; Wen, S. Z. Langmuir 2000, 16, 662-670.
35. Enacheseu, M.; van den Oetelaar, R.; Carpick, R.; Ogletree, D.; Flipse. C.; Salmeron, M. Tribal. Lett. 1999, 7, 73-78.
36. Carpick, R.; Ogletree, D.; Salmeron, M. J. Colloid Interface Sci. 1999, 211, 395-400.
37. The "after" radii were estimated via the lateral calibration sample. Topographs of the crests of the wedge grating provided an upper bound to the sharpness of the tip. Radii were calculated by fitting parabolas to the topographs ± 45 nm on either side of the crest.
38. Derjaguin, B. V.; Muller, V. M.; Toporov, Y. P. J. Colloid Interface Sci. 1975, 53, 314-326.
39. Nakagawa, T.; Ogawa, K.; Kurumizawa, T. J. Vacuum Sci. Technol., B 1994, 12, 2215-2218.
40. Richter, R. P.; Brisson, A. Langmuir 2003, 19, 1632-1640.
41. Israelachvili, Adhesion, Friction, and Lubrication of Molecularly Smooth Surfaces. In Fundamentals of Friction: Macroscopic and Microscopic Processes; Singer, I. L., Pollock, H. M., Eds.; Kluwer Academic Publishers: Dordrecht, The Netherlands, 1992; Vol. 220, pp 351-385.
42. Yoshizawa, H.; Chen, Y. L.; Israelachvili, J. Wear 1993, 168, 161-166.
43. We note that those vapor-deposited metal surfaces consist of "irregularly shaped grains...from 0.3 to 1.0 mm" and are much rougher (as measured by AFM) than the alumina or sapphire used here.
44. Kelley, T. W.; Boardman, L. D.; Dunbar, T. D.; Muyres, D. V.; Pellerite, M. J.; Smith, T. Y. P. J. Phys. Chem. B 2003, 107, 5877-5881.
45. Tsao, M.; Hoffmann, C.; Rabolt, J.; Johnson, H.; Castner, D.; Erdelen, C.; Ringsdorf, H. Langmuir 1997, 13, 4317-4322.
46. Fukushima, H.; Seki, S.; Nishikawa, T.; Takiguchi, H.; Tamada, K.; Abe, K.; Colorado, R.; Graupe, M.; Shmakova, O. E.; Lee, T. R.J. Phys. Chem. B2000, 104, 7417-7423.
47. Frey, S.; Heister, K.; Zharnikov, M.; Grunze, M.; Tamada, K.; Colorado, R.; Graupe, M.; Shmakova, O. E.; Lee, T. R. Isr. J. Chem. 2000, 40, 81-97.
48. Timmons, C. O.; Zisman, W. A. J. Colloid Interface Sci. 1966, 22, 165-171.
49. Chaudhury, M. K. Mater. Sci. Eng., R 1996, 16, 97-159.
50. Lestelius, M.; Engquist, I.; Tengvall, P.; Chaudhury, M. K.; Liedberg, B. Colloids Surf., B 1999, 15, 57-70.
51. Park, J. S.; Vo, A. N.; Barriet, D.; Shon, Y. S.; Lee,T. R. Langmuir 2005. 21, 2902-2911.
52. Bain, C. D.; Troughton, E. B.; Tao, Y. T.; Evall, J.; Whitesides, G. M.; Nuzzo, R. G. J. Am. Chem. Soc. 1989, 111, 321-335.
53. Liakos, I. L.; Newman, R. C.; McAlpine, E.; Alexander, M. R. Surf. Interface Anal. 2004, 36, 347-354.
54. Atre, S. V.; Liedberg, B.; Allara, D. L. Langmuir 1995, 11, 3882-3893.
55. Allara, D. L.; Atre, S. V.; Elliger, C. A.; Snyder, R. G. J. Am. Chem. Soc. 1991, 113, 1852-1854.
56. Weinstein, R. D.; Moriarty, J.; Cushnie, E.; Colorado, R., Jr.; Lee, T. R.; Patel, M.; Alesi, W. R.; Jennings, G. K. J. Phys. Chem. B 2003, 107, 11626.
57. Leggett, G. J. Anal. Chim. Acta 2003, 479, 17-38.
58. Burns, A. R.; Houston, J. E.; Carpick, R. W.; Michalske, T. A. Phys. Rev. Lett. 1999, 82, 1181.
59. Thomas, R. C.; Houston, J. E.; Crooks, R. M.; Kim, T.; Michalske, T. A. J. Am. Chem. Soc. 1995, 117, 3830-3834.
60. Park, B.; Lorenz, C. D.; Chandross, M.; Stevens, M. J.; Grest, G. S.; Borodin, O. A. Langmuir 2004, 20, 10007-10014.
61. Kim, H. I.; Graupe, M.; Oloba, O.; Koini, T.; Imaduddin, S.; Lee, T. R.; Perry, S. S. Langmuir 1999, 15, 3179-3185.
62. Graupe, M.; Koini, T.; Kim, H. I.; Garg, N.; Miura, Y. F.; Takenaga, M.; Perry, S. S.; Lee, T. R. Colloids Surf., A 1999, 154, 239-244.
63. Kim, H. I.; Koini, T.; Lee, T. R.; Perry, S. S. Tribol. Lett. 1998, 4, 137-40.
64. Carpick, R. W.; Ogletree, D. F.; Salmeron, M. J. Colloid Interface Sci. 1999, 211, 395-400.
65. Singer, I. L., Pollock, H. M. Fundamentals of Friction: Macroscopic and Microscopic Processes. Kluwer: Dordrecht, The Netherlands, 1992.
66. Singer, I. L. Solid Lubrication Processes. In Fundamentals of Friction: Macroscopic and Microscopic Processes; Singer, I. L., Pollock, H. M., Eds.; Kluwer: Dordrecht, The Netherlands, 1992; Vol. 220, p 237.
67. Carpick, R. W.; Agraït, N.; Ogletree, D. F.; Salmeron, M. Langmuir 1996, 12, 3334-3340.
68. Carpick, R. W.; Agraït, N.; Ogletree, D. F.; Salmeron, M. J. Vacuum Sci. Technol., B 1996, 14, 1289-1295.
69. Luthi, R.; Meyer, E.; Bammerlin, M.; Howald, L.; Haefke, H.; Lehmann, T.; Loppacher, C.; Guntherodt, H.; Gyalog, T.; Thomas, H. J. Vacuum Sci. Technol., B 1996, 14, 1280-1284.
70. Carpick, R. W.; Salmeron, M. Chem. Rev. 1997, 97, 1163-1194.
71. Lantz, M. A.; O'Shea, S. J.; Weiland, M. E.; Johnson, K. L. Phys. Rev. B: Condens. Matter 1997, 55, 10776-10785.
72. Lantz, M. A.; O'Shea, S. J.; Weiland, M. E. Phys. Rev. B: Condens. Matter 1997, 56, 15345-15352.
73. Johnson, K. L. Proc. R. Soc. London, Ser. A 1997, 453, 163.
74. Enachescu, M.; van den Oetelaar, R.; Carpick, R.; Ogletree, D.; Flipse, C.; Salmeron, M. Phys. Rev. Lett. 1998, 81, 1877-1880.
75. Carpick, R. W.; Enachescu, M.; Ogletree, D. F.; Salmeron, M. Making, Breaking, and Sliding of Nanometer-Scale Contacts. In Fracture and Ductile vs. Brittle Behavior-Theory, Modelling, and Experiment; Beltz, G., Kim, K.-S., Selinger, R. L., Eds.; Materials Research Society: Warrendale, PA, 1999; pp 93-103.
76. Wei, Z.; Wang, C.; Bai, C. Langmuir 2001, 17, 3945-3951.
77. Piétrement, O.; Troyon, M. Langmuir 2001, 17, 6540-6546.
78. Piétrement, O.; Troyon, M. Surf. Interface Anal. 2001, 31, 1060-1067.
79. Johnson, K. L. Contact Mechanics. Cambridge University Press: Cambridge, U.K., 1985; p 452.
80. Carpick, R.; Agrait, N.; Ogletree, D.; Salmeron, M. J. Vacuum Sci. Tecknol., B 1996, 14, 1289-1295.
81. Eyring, H. J. J. Chem. Phys. 1935, 3, 107.
82. Eyring, H. J. J. Chem. Phys. 1936, 4, 283.
83. McDermott, M. T.; Green, J. B. D.; Porter, M. D. Langmuir 1997, 13, 2504-2510.
84. Tutein, A. B.; Stuart, S. J.; Harrison, J. A. Langmuir 2000, 16, 291-296.
85. Lee, S.; Shon, Y. S.; Colorado, R.; Guenard, R. L.; Lee, T. R.; Perry, S. S. Langmuir 2000, 16, 2220-2224.
86. Lio, A.; Charych, D. H.; Salmeron, M. J. Phys. Chem. B 1997, 101, 3800-3805.
87. Chandross, M.; Webb, E. B.; Stevens, M. J.; Grest, G. S.; Garofalini, S. H. Phys. Rev. Lett. 2004, 93, 166103.
88. Muser, M. H.; Wenning, L.; Robbins, M. O. Phys. Rev. Lett. 2001, 86, 1295-1298.