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Volumn 99, Issue 10, 1999, Pages 2845-2890

Chemical and Biochemical Analysis Using Scanning Force Microscopy

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000229734     PISSN: 00092665     EISSN: None     Source Type: Journal    
DOI: 10.1021/cr9801317     Document Type: Article
Times cited : (226)

References (404)
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    • 0042402435 scopus 로고    scopus 로고
    • Bullis, W. M., Seiler, D. G., Diebold, A. C., Eds.; AIP Press: Woodbury, NY
    • Feenstra, R. M.; Griffith, J. E. In Semiconductor Characterization; Bullis, W. M., Seiler, D. G., Diebold, A. C., Eds.; AIP Press: Woodbury, NY, 1996; p 295.
    • (1996) Semiconductor Characterization , pp. 295
    • Feenstra, R.M.1    Griffith, J.E.2
  • 67
  • 281
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  • 401
    • 0000153104 scopus 로고    scopus 로고
    • Chem. Rev. 1997, 97, 2463-2706.
    • (1997) Chem. Rev. , vol.97 , pp. 2463-2706


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.