Nanometer-scale elasticity measurements on organic monolayers using scanning force microscopy

Surface and Interface Analysis

Volumn 25, Issue 6, 1997, Pages 383-389

  Kiridena, Waruna ^a   Jain, Vijay ^a   Kuo, P K ^a   Liu, Gang Yu ^a  

^a WAYNE STATE UNIVERSITY   (United States)

Author keywords

Atomic force microscopy (AFM); Elastic compliance; Elasticity; Force modulation microscopy; Self assembled monolayers

Indexed keywords

ADSORPTION; ATOMIC FORCE MICROSCOPY; ELASTIC MODULI; ELASTICITY; GOLD; MICA; NATURAL FREQUENCIES; SILANES; SUBSTRATES; SURFACE STRUCTURE; THIN FILMS; WATER;

ALKANETHIOL; FORCE MODULATION MICROSCOPY; OCTADECYLTRIETHOXYSILANES; SCANNING FORCE MICROSCOPY; SURFACE TOPOGRAPHY;

MONOLAYERS;

EID: 0031166821     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199706)25:6<383::AID-SIA246>3.0.CO;2-S     Document Type: Article

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