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This estimate of resolution is based upon an analysis (see ref 8) of 2-μm-sized images, which were collected by scanning across partial portions of the patterned domains of the samples in Figure 2A,B. Issues related, for example, to the differences in the friction between domains, however, must be considered when attempting to translate the resolution estimated for the arrays in Figure 2A,B to other samples.
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The friction responses reported in Figure 3 are approximately twice that described in our previous work (see ref 23). This difference is attributed to differences in the types of tips used in the two separate studies. Our earlier data were obtained using conventional silicon nitride tips, whereas the results in Figure 3 were acquired using oxide-sharpened tips. Thus, differences in the size, shape, and probable surface composition of the two types of tips result in the observed differences in the FFM-measured friction. Factors such as the mechanical properties of the tip, sample, and tip - sample microcontact, all of which we are presently attempting to detail further, also play roles that are not well understood.
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