Imaging charged functional groups with an atomic force microscope operated in aqueous solutions

Journal of Electroanalytical Chemistry

Volumn 438, Issue 1-2, 1997, Pages 225-230

  Ishino, Takashi ^a   Hieda, Hiroyuki ^a   Tanaka, Kuniyoshi ^a   Gemma, Nobuhiro ^a  

^a TOSHIBA CORPORATION   (Japan)

Author keywords

Atomic force microscopy; Functional groups; Imaging

Indexed keywords

ATOMIC FORCE MICROSCOPY; IMAGING TECHNIQUES; SOLUTIONS; SUBSTRATES; SULFUR COMPOUNDS;

ALKANETHIOL; LANGMUIR BLODGETT METHOD;

ELECTROCHEMISTRY;

EID: 0031273226     PISSN: 15726657     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0728(97)00048-X     Document Type: Article

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