Friction force microscopy measurements: Normal and torsional spring constants for v-shaped cantilevers

Journal of Tribology

Volumn 120, Issue 4, 1998, Pages 814-819

  Hazel, J L ^a   Tsukruk, V V ^a  

^a Parkview Campus   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BENDING (DEFORMATION); CANTILEVER BEAMS; CERAMIC MATERIALS; ELASTIC MODULI; FINITE ELEMENT METHOD; GOLD; MICROSCOPIC EXAMINATION; NATURAL FREQUENCIES; SILICON NITRIDE; TORSIONAL STRESS;

FRICTION FORCE MICROSCOPY; V-SHAPED CANTILEVERS;

FRICTION;

FINITE ELEMENT ANALYSIS; FRICTION; RESONANCE;

EID: 0032194226     PISSN: 07424787     EISSN: 15288897     Source Type: Journal    
DOI: 10.1115/1.2833784     Document Type: Article

References (40)

1. Albrecht, T. R., Akamine, S., Carver, T. E., and Quate, C. F., 1990, “Microfabrication of Cantilever Styli for the Atomic Force Microscope,” J. Vac. Sci, and Technol, Vol. A8, pp. 3386-3396.
2. Beer, F. P., and Johnson Jr., E. R., 1981, Mechanics of Materials, McGrawHill, NY.
3. Bhushan, B., and Blackman, G. S., 1991, “Atomic Force Microscopy of Magnetic Rigid Discs and Sliders and Its Application to Tribology,” ASME Journal of Tribology, Vol. 113, pp. 452-457.
4. Bhushan, B., and Ruan, J.-A., 1994, “Atomic Scale Friction Measurements Using Friction Force Microscopy: II,” ASME Journal of Tribology, Vol. 116, pp. 389-396.
5. Bhushan, B., Israelachvili, J. N., and Landman, U., 1995, “Nanotribology: Friction, Wear, and Lubrication at the Atomic Scale,” Nature, Vol. 374, pp. 607-616.
6. Bhushan, B., Kulkarni, A. V., Koinkar, V. N., Boehm, M., Odoni, L., Martelet, C., and Belin, M., 1995, “Microtribological Characterization of Self-Assembled and Langmuir-Blodgett Monolayers by Atomic and Friction Force Microscopy,” Langmuir, Vol. 11, pp. 3189-3198.
7. Bliznyuk, V. N., Everson, M. P., and Tsukruk, V. V., 1998, “Nanotribological Properties of Organic Boundary Lubricants: Langmuir Films Versus Self-Assembled Monolayers,” ASME Journal of Tribology, accepted for publication.
8. Burnham, N. A., Dominquez, D., Mowery, R. L., and Colton, R. J., 1990, “Probing of Surface Forces of Monolayer Films with an Atomic-Force Microscope,” Phys. Rev. Lett., Vol. 64, pp. 1931-1934.
9. Butt, H.-J., Siedle, P., Seifert, K., Fendler, K., Seeger, T., Bamberg, E., Weisenhorn, A. L., Goldie, K., and Engel, A., 1993, “Scan Speed Limit in Atomic Force Microscopy,” J. Microscopy, Vol. 169, pp. 75-84.
10. Cleveland, J., Manne, S., Bocek, D., and Hansma, P. K., 1993, “A Nondestructive Method for Determining the Spring Constant of Cantilevers for Scanning Force Microscopy,” Rev. Sci. Instrum., Vol. 64, pp. 403-405.
11. Cleveland, J., 1996, “Spring Constant Update,” unpublished results, Digital Instruments, Santa Barbara, CA.
12. Cutiongo, E. C., Li, D., Chung, Y., and Bhatia, C. S., 1996, “Tribological Behavior of Amorphous Carbon Nitride Overcoats for Magnetic Discs,” ASME Journal of Tribology, Vol. 118, pp. 543-549.
13. Friedenberg, M. C., and Mate, C. M., 1996, “Dynamic Viscoelastic Properties of Liquid Polymer Films Studied by Atomic Force Microscopy,” Langmuir, Vol. 12, pp. 6138-6142.
14. Green, J.-B., McDermot, M. T., Porter, M. D., and Siperko, L. M., 1995, “Nanometer-Scale Mapping of Chemically Distinct Domains Using Frictional Force Microscopy,” J. Phys. Chem., Vol. 99, pp. 10960-10965.
15. Hazel, J., and Tsukruk, V. V., 1996, “Quantitative Force Measurements in • SPM: Vertical and Torsional Spring Constants for V-shaped Cantilevers,” Polymer Prepr., Vol. 37(2), pp. 567-568.
16. Hazel, J., and Tsukruk, V. V., 1998, “Spring Constants Of Microfabricated Ceramic/Gold Cantilevers For Scanning Probe Microscopy,” Thin Solid Films, accepted.
17. Jiang, Z., Lu, C-J., Bogy, D. B., and Miyamoto, T., 1995, “Dependence of Nano-Friction and Nano-Wear on Loading Force for Sharp Diamond Tips Sliding on Si, Mn-Zn Ferrite, and Au,” ASME Journal of Tribology, Vol. 117, pp. 328-341.
18. Elliot, D., 1986, Microlithography; Process Technology for IC Fabrication, Halliday Lith., NY.
19. Labardi, M., Allegrini, M., Salerno, M., Frediani, C., and Ascoli, C., 1994, “Dynamical Friction Coefficient Map Using a Scanning Force and Friction Microscope,” Appl. Phys., A74, pp. 3-10.
20. Mate, C. M., McClelland, G. M., Erlandsson, R., and Chiang, S., 1987, “Atomic-Scale Friction of a Tungsten Tip on a Graphite Surface,” Phys. Rev. Lett., Vol. 59, pp. 1942-1945.
21. Meyer, E., Overney, R., Luthi, R., Brodbeck, D., Howard, L., Frommer, J., Guntherodt, H-J., Wolter, O., Fujihira, M., Takano, T., and Gotoh, Y., 1992, “Friction Force Microscopy of Mixed Langmuir-Blodgett Films,” Thin Solid Films, Vol. 220, pp. 132-137.
22. Neumeister, J. M., and Ducker, W. A., 1994, “Lateral, Normal, and Longitudinal Spring Constants of Atomic Force Microscopy Cantilevers,” Rev. Sci. Instrum., Vol. 65, pp. 2527-2531.
23. Noy, A., Frisbie, C. D., Rozsnyai, L. F., Wrighton, M. S., and Lieber, C. M., 1995, “Chemical Force Microscopy: Exploiting Chemically-Modified Tips to Quantify Adhesion, Friction, and Functional Group Distribution in Molecular Assemblies,” J. Am. Chem. Soc., Vol. 117, pp. 7943-7951.
24. Ogletree, D. F., Carpick, R. W., and Salmeron, M., 1996, “Calibration of Frictional Forces in Atomic Force Microscopy,” Rev. Sci. Instrum., Vol. 67, pp. 3298-3305.
25. Overney, R., Meyer, E., Frommer, J., Brodbeck, D., Luthi, R., Howard, L., Guntherodt, H-J., Wolter, O., Fujihira, M., Takano, T., and Gotoh, Y., 1992, “Friction Measurements on Phase-Separated Thin Films with A Modified Atomic Force Microscopy,” Nature, Vol. 359, pp. 133-135.
26. Overney, R. M., 1995, “Nanotribological Studies of Polymers,” Trends in Polym. Sci., Vol. 3, pp. 359-364.
27. Peterson, K. E., and Guarnieri, C. R., 1979, “Young’s Modulus Measurements of Thin Films Using Micromechanics,” J. Appl. Phys., Vol. 50, pp. 6761-6766.
28. Ruan, J.-A., and Bhushan, B., 1994, “Atomic Scale Friction Measurements Using Friction Force Microscopy: I,” ASME Journal of Tribology, Vol. 116, pp. 378-388.
29. Sader, J. E., 1995, “Parallel Beam Approximation for V-shaped Atomic Force Microscope Cantilevers,” Rev. Sci. Instrum., Vol. 66, pp. 4583-4587.
30. Sader, J. E., Larson, I., Mulvaney, P., and White, L. R., 1995, “Method for the Calibration of Atomic Force Microscope Cantilevers,” Rev. Sci. Instrum., Vol. 66, pp. 3789-3798.
31. Senden, T., and Ducker, W., 1994, “Experimental Determination of Spring Constants in Atomic Force Microscopy,” Langmuir, Vol. 10, pp. 1003-1004.
32. Tsukruk, V. V., Bliznyuk, V. N., Hazel, J., Visser, D., and Everson, M. P., 1996a, “Organic Molecular Films Under Shear Forces: Fluid and Solid Langmuir Monolayers,” Langmuir, Vol. 12, pp. 4840-4849.
33. 60 Anchored to a Self-Assembled Monolayer,” Langmuir, Vol. 12, pp. 3905-3913.
34. Tsukruk, V. V., Bliznyuk, V. N., Visser, D., and Hazel, J., 1996c, “Reconstruction of Fluid Langmuir Monolayers under Shear Forces,” Tribology Letters, Vol. 2, pp. 71-77.
35. Tsukruk, V. V., Bliznyuk, V. N., and Everson, M. P., 1996, “Nanotribology of Composite Molecular Layers,” Polymer Prepr., Vol. 37(2), pp. 557-558.
36. Tsukruk, V. V., and Ratner, B., Eds., 1998, Scanning Probe Microscopy in Polymers, ACS Symposium Series, Washington DC, v. 694.
37. Tsukruk, VV., 1998a, “Scanning Probe Microscopy of Polymer Surfaces,” Rubber Chem. Techn., Vol. 70, pp. 432-480.
38. Tsukruk, V. V., and Bliznyuk, V. N., 1998b, “Adhesive and friction forces probed by chemically modified SPM tips,” Langmuir, Vol. 14, pp. 446-455.
39. Walters, D. A., Cleveland, J. P., Thomson, N. H., Hansma, P. K., Wendman, M. A., Gurdey, G., and Ellings, V., 1996, “Short Cantilevers for Atomic Force Microscopy,” Rev. Sci. Instrum., Vol. 67, pp. 3583-3590.
40. Warmack, R. J., Zheng, X.-Y., Thundat, T., and Allison, D. P., 1994, “Friction Effects in the deflection of Atomic Force Microscope Cantilevers,” Rev. Sci. Instrum., Vol. 65, pp, 394-399