Measurements of single-molecule bond-rupture forces between self-assembled monolayers of organosilanes with the atomic force microscope

Langmuir

Volumn 13, Issue 14, 1997, Pages 3761-3768

  Wenzler, L A ^a   Moyes, G L ^a   Raikar, G N ^a   Hansen, R L ^a   Harris, J M ^a   Beebe Jr , T P ^a   Wood, L L ^b   Saavedra, S S ^b  

^a UNIVERSITY OF UTAH   (United States)

^b University of Arizona   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ANGLE MEASUREMENT; ATOMIC FORCE MICROSCOPY; CONTACT ANGLE; GLASS; HYDROGEN BONDS; MONOLAYERS; SILICA; X RAY PHOTOELECTRON SPECTROSCOPY;

SINGLE MOLECULE BOND RUPTURE FORCES;

SILANES;

EID: 0031561060     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la9620869     Document Type: Article

References (54)

1. Nuzzo, R. G.; Allara, D. L. J. Am. Chem. Soc. 1983, 105, 4481.
2. Porter, M. D.;Bright,T. B.; Allara, D. L.; Chidsey, C. E. D. J. Am. Chem. Soc. 1987, 109, 3559.
3. Troughton, E. B.; Bain, C. D.; Whitesides, G. M.; Nuzzo, R. G.; Allara, D. L.; Porter, M. D. Langmuir 1988, 4, 365.
4. (a) Bain, C. D.; Whitesides, G. M. J. Am. Chem. Soc. 1988, 110, 3665.
5. (b) Bain, C. D.; Whitesides, G. M. J. Am. Chem. Soc. 1988, 110, 6560.
6. (c) Bain, C. D.;Troughton, E. B.; Tao,Y.T.; Evall, J.;Whitesides, G. M.; Nuzzo, R. G. J. Am. Chem. Soc. 1989, 111, 321.
7. (d) Bain, C. D.; Whitesides, G. M. J. Am. Chem. Soc. 1989,111, 7155.
8. (e) Bain, C. D.; Whitesides, G. M. J. Am. Chem. Soc. 1989, 111, 7164.
9. Ulman, A. Characterization of Organic Thin Films; Butterworth-Heinemann: Boston, 1995.
10. Ulman, A. An Introduction to Ultrathin Organic Films: from Langmuir-Blodgett to Self-Assembly; Academic Press: Boston, 1991.
11. Netzer, L.; Sagiv, J. J. Am. Chem. Soc. 1983, 105, 674.
12. Sagiv, J. J. Am. Chem. Soc. 1980, 102, 92.
13. Netzer, L.; Iscovici, R.; Sagiv, J. Thin Solid Films 1983, 90, 235.
14. Netzer, L.; Iscovici, R.; Sagiv, J. Thin Solid Films 1983, 100, 67.
15. Cohen, S. R.; Naaman, R.; Sagiv, J. J. Phys. Chem. 1986, 90, 3054.
16. Maoz, R.; Sagiv, J. Thin Solid Films 1985, 132, 135.
17. ( 13) Finklea, H. O.; Robinson, L. R.; Blackburn, A.; Richter, B.; Allara, D.; Bright, T. Langmuir 1986, 2, 239.
18. Tillman, N.; Ulman, A.; Penner, T. L. Langmuir 1989, 5, 101.
19. Wasserman, S. R.; Siebuyck, H.; Whitesides, G. M. J. Mater. Res. 1989, 4, 886.
20. Balachander, N.; Sukenik, C. N. Langmuir 1990, 6, 1621.
21. Williams, J. M.; Han, T.; Beebe, T. P., Jr. Langmuir 1996, 12, 1291.
22. Han, T.; Williams, J. M.; Beebe, T. P., Jr. Anal. Chim. Acta 1995, 307, 365.
23. Wenzler, L. A.; Moyes, G. L.; Olson, L. G.; Harris, J. M.; Beebe, T. P., Jr. Adhesion Force Analysis of Interactions Between AFM Tips and Substrates Modified with Organosilanes. Anal. Chem., in press.
24. Barlow, R. Statistics; John Wiley & Sons, Inc.: New York, 1988.
25. Hoh, J. H.;Cleveland, J. P.; Prater,C.B.;Revel, J.-P,;Hansma, P. K. J. Am. Chem. Soc. 1992, 114, 4917.
26. Thomas, R. C.; Houston, J. E.; Crooks, R. M.; Kim, T.; Michalske, T. A. J. Am. Chem. Soc. 1995, 117, 3830.
27. Lee, G. U.; Kidwell, D. A.; Colton, R. J. Langmuir 1994, 10, 354.
28. Florin, E.-L.; Moy, V. T.; Gaub, H. E. Science 1994, 264, 415. Moy, V. T.; Florin, E.-L.; Gaub, H. E. Science 1994, 266, 257.
29. Florin, E.-L.; Moy, V. T.; Gaub, H. E. Science 1994, 264, 415. Moy, V. T.; Florin, E.-L.; Gaub, H. E. Science 1994, 266, 257.
30. Hinterdorfor, P.; Baumgartner, W.; Gruber, H. J.; Schilcher, K.; Schindler, H. Proc. Natl. Acad. Sci, U.SA. 1996, 93, 3477.
31. Stuart, J. K.; Hlady, V. Langmuir 1995, 11, 1368.
32. Lee, G. U.; Chrisey, L. A.; Colton, R. J. Science 1994, 266, 771,
33. Biggs, S. Langmuir 1995, 11, 156. Biggs, S.; Mulvaney, P. J. Chem. Phys. 1994, 100, 8501.
34. Biggs, S. Langmuir 1995, 11, 156. Biggs, S.; Mulvaney, P. J. Chem. Phys. 1994, 100, 8501.
35. Rabinovich, Y. I.; Yoon, R.-H. Langmuir 1994, 10, 1903. Rabinovich, Y. I.; Yoon, R.-H. Colloids Surf. 1994, 93, 263.
36. Rabinovich, Y. I.; Yoon, R.-H. Langmuir 1994, 10, 1903. Rabinovich, Y. I.; Yoon, R.-H. Colloids Surf. 1994, 93, 263.
37. Mantel, M.; Rabinovich, Y. L; Wightman, J. P.; Yoon, R.-H. J. Colloid Interface Sci. 1995, 170, 203.
38. Noy, A.; Frisbie, D.; Rozsnyai, L. F.; Wrighton, M. S.; Lieber, C. M. J. Am. Chem. Soc. 1995, 117, 7943.
39. Edmiston, P. L.; Lee, J. E,; Cheng, S.-S.; Saavedra, S. S. Molecular Orientation Distributions in Protein Films. I. Cytochrome c Adsorbed to Substrates of Variable Surface Chemistry. J. Am. Chem. Soc., in press.
40. Holland, L. Vacuum Deposition of Thin Films; John Wiley & Sons, Inc.: New York, 1956; pp 449-450.
41. George, J. Preparation of Thin Films; Marcel Dekker: New York, 1992.
42. Vacuum Deposition Chemicals & Evaporation Materials, 3rd ed.; CERAC, Inc.: Milwaukee, WI, 1988; pp 11-12.
43. Lacy, W. B.; Williams, J. M.; Wenzler, L. A.; Beebe, T. P., Jr.; Harris, J. M. Anal. Chem. 1996, 68, 1003.
44. Cleveland, J. P.; Manne, S.; Bocek, D.; Hansma, P. K. Rev. Sci. lnstrum. 1993, 64, 403.
45. Drake, B.; Prater, C. B.; Weisenhorn, A. L.; Gould, S. A. C.; Albrecht, T. R.; Quate, C. F.; Cannell, D. S.; Hansma, H. G.; Hansma, P. K. Science 1989, 243, 1586.
46. Hoh, J. H.; Engel, A. Langmuir 1993, 9, 3310.
47. i) is used for the calculation of the atomic concentration ratio of the three major elements in thiols. C, I, and S represent the atomic concentration ratio, XPS intensity, and XPS sensitivity factor, respectively. S values for the XPS data taken with the ESCALab 22Oi-XL are as follows: carbon 1.0, oxygen 2.93, silicon 0.82, chlorine 2.29, and sulfur 1.68. Wagner, C. D. Surf. Interface Anal. 1981, 3, 211.
48. Iler, R. K. The Chemistry of Silica; Wiley: New York, 1979; Chapter 6.
49. Wagner, C. D.; Riggs, W. M.; Davis, L. E.; Moulder, J. F. In ; Handbook of X-ray Photoelectron Spectroscopy; Muhlenberg, G. E., Ed.; Perkin-Elmer Corp.: Eden Prairie, MN, 1978.
50. Sun, F.; Grainger, D. W.; Castner, D. G. J. Vac. Sci. Technol. 1994, 12, 2499.
51. XPS images of AFM cantilevers modified with some similar "Sagiv-type" monolayers have been presented in another work from this group (see ref 19).
52. Israelachvili, J. Intermolecular & Surface Forces; Academic Press Inc.: San Diego, 1992.
53. o. The repulsive portion of V(r) is neglected, therefore giving an overestimation of the true energy. See also ref 45. Converting bond-rupture forces to bond energies thus involves several assumptions which were described above. The bond-rupture magnitudes are not limited by these assumptions.
54. Both the acetate- and thioacetate-terminated silanes were analyzed in DMSO and 1-propanol in addition to water. Unlike in water, these solvents exhibited no observable pull-off force and could therefore not be analyzed.