Direct measurement of diffuse double-layer forces at the semiconductor/electrolyte interface using an atomic force microscope

Journal of Physical Chemistry B

Volumn 101, Issue 41, 1997, Pages 8298-8303

  Hu, Kai ^a   Fan, Fu Ren F ^a   Bard, Allen J ^a   Hillier, Andrew C ^b  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

^b University of Virginia   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROCHEMISTRY; ELECTROLYTES; INTERFACES (MATERIALS); SEMICONDUCTOR MATERIALS; SILICA; TITANIUM DIOXIDE;

DOUBLE ELECTRIC LAYER;

ELECTROCHEMICAL ELECTRODES;

EID: 0031561262     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp971887x     Document Type: Article

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