Direct measurement of diffuse double-layer forces at the semiconductor/electrolyte interface using an atomic force microscope

Journal of Physical Chemistry B

Volumn 101, Issue 41, 1997, Pages 8298-8303

  Hu, Kai ^a   Fan, Fu Ren F ^a   Bard, Allen J ^a   Hillier, Andrew C ^b  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

^b University of Virginia ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROCHEMISTRY; ELECTROLYTES; INTERFACES (MATERIALS); SEMICONDUCTOR MATERIALS; SILICA; TITANIUM DIOXIDE;

DOUBLE ELECTRIC LAYER;

ELECTROCHEMICAL ELECTRODES;

EID: 0031561262     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp971887x     Document Type: Article

References (43)

1. Israelachvili, J. N. Intermolecular and Surface Forces. 2nd ed.; Academic Press: New York, 1991.
2. (a) Israelachvili, J. N.; Adams, G. E. J. Chem. Soc., Faraday Trans. 1 1978, 74, 975.
3. (b) Parker, J. L.; Christenson, H. K.; Ninham, B. W. Rev. Sci. Instrum. 1989, 60, 3135.
4. Claesson, P. M.; Ederth, T.; Bergeron, V.; Rutland, M. W. Adv. Colloid Interface Sci. 1996, 67, 119.
5. For review see, for example: Butt, H.-J.; Jaschke, M.; Ducker, W. Bioelectrochem. Bioenerg. 1995, 38, 191.
6. (a) Ducker, W. A.; Senden, T. J.; Pashley, R. M. Nature 1991, 353, 2239.
7. (b) Ducker, W. A.; Senden, T. J.; Pashley, R. M. Langmuir 1992, 8, 1831.
8. (a) Atkins, D. T.; Pashley, R. M. Langmuir 1993, 9, 2232.
9. (b) Larson, I.; Drummond, C. J.; Chan, D. Y. C. J. Am. Chem. Soc. 1993, 115, 25.
10. (c) Larson, I.; Drummond, C. J.; Chan, D. Y. C.; Grieser, F. J. Phys. Chem. 1995, 99, 2114.
11. (a) Li, Y. Q.; Tao, N. J.; Pan, J.; Garcia, A. A.; Lindsay, S. M. Langmuir 1993, 9, 637.
12. (b) Karaman, M. E.; Meagher, L.; Pashley, R. M. Langmuir 1993, 9, 1220.
13. (d) Meagher, L.; Craig, V. S. J. Langmuir 1994, 10, 2736.
14. (a) Biggs, S.; Chow, M. K.; Zukoski, C. F.; Grieser, F. J. Colloid Interface Sci. 1993, 160, 511.
15. (b) Biggs, S.; Mulvaney, P. J. Chem. Phys. 1994, 100, 8501.
16. (c) Biggs, S.; Mulvaney, P.; Zukoski, C. F.; Grieser, F. J. Am. Chem. Soc. 1994, 116, 9150.
17. Rutland, M. W.; Senden, T. J. Langmuir 1993, 9, 412.
18. (a) O'Shea, S. J.; Weiland, M. E.; Rayment, T. Langmuir 1993, 9, 1826.
19. (b) Rabinovich, Y. I.; Yoon, R.-H. Langmuir 1994, 10, 1903.
20. (c) Biggs, S. Langmuir 1995, 11, 156.
21. Derjaguin, B. V.; Voropayeva, T. N.; Kabanov, B. N.; Titiyevskaya, A. S. J. Colloid Sci. 1964, 19, 113.
22. Fan, F.-R. F.; Bard, A. J. J. Am. Chem. Soc. 1987, 109, 6262.
23. (a) Parker, J. L.; Christenson, H. K. J. Chem. Phys. 1988, 88, 8013.
24. (b) Smith, C. P.; Maeda, M.; Atanososka, L.; White, H. S.; McClure, D. J. J. Phys. Chem. 1988, 92, 199.
25. (a) Ishino, T.; Hieda, H.; Tanaka, K.; Gemma, N. Jpn. J. Appl. Phys. 1994, 33, L1552.
26. (b) Raiteri, R.; Grattarola, M.; Butt, H.-J. J. Phys. Chem. 1996, 100, 16700.
27. Millier, A. C.; Kim, S.; Bard, A. J. J. Phys. Chem. 1996, 100, 18808.
28. (a) Grahame. D. C. Chem. Rev. (Washington, D.C.) 1947, 41, 441.
29. (b) Meites, L. J. Am. Chem. Soc. 1951, 73, 2035.
30. (a) Clavilier, J.; Nguyen, V. H. J. Electroanal. Chem. 1973, 41, 193.
31. (b) Tucceri, R. I.; Posadas, D. J. Electroanal. Chem. 1985, 191, 387.
32. (c) Piela, B.; Wrona, P. K. J. Electroanal. Chem. 1995, 388, 69.
33. (a) Cleveland, J. P.; Manne, S.; Bocek, D.; Hansma, P. K. Rev. Sci. Instrum. 1993, 64, 403.
34. (b) Sader, J. E.; Larson, I.; Mulvaney, P.; White, L. R. Rev. Sci. Instrum. 1995, 66, 3789.
35. (a) Derjaguin, B. Trans. Faraday Soc. 1940, 36, 203.
36. (b) Derjaguin, B. V.; Landau, L. D. Acta Phys. Chem. 1941, 14, 633.
37. (c) Derjaguin, B. V.; Landau, L. D. J. Exp. Theor. Phys. 1941, 11, 802.
38. (d) Verway, E. J. W.; Overbeek, J. T. G. Theory of the Stability of Lyophobic Colloids; Elsevier: New York, 1948.
39. Derjaguin, B. V. Kolloid Z. 1934, 69, 155.
40. Parker, J. L. Surf. Sci. 1994, 3, 205.
41. Grabbe, A.; Horn, R. G. J. Colloid Interface Sci. 1993, 157, 375.
42. Finklea, H. O. In Semiconductor Electrodes; Finklea, H. O, Ed.; Elsevier: Amsterdam, 1988; pp 1-42.
43. Ahmed, S. M.; Ahmed. A. In Photoelectrochemistry: Fundamental Processes and Measurement Techniques: Wallace, W. L., Nozik, A. J., Deb, S. K., Wilson, R. H., Eds.; The Electrochemical Society: Pennington, NJ, 1982; Proc. Vol. 82-3, pp 408-422.