Atomic force microscopy images obtained with C60 modified tips

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 2, 1996, Pages 1318-1321

  Kim, Sanghee ^a,b   Park, Sang Kyu ^a   Park, Chan ^a,b   Jeon II, Cheol ^a  

^a Chonbuk National University   (South Korea)

^b Department of Physics ^*

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0009580142     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589088     Document Type: Article

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