Effects of electric potentials on surface forces in electrolyte solutions

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 2, 1996, Pages 1378-1382

  Arai, Toyoko ^a   Fujihira, Masamichi ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001758440     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589102     Document Type: Article

References (35)

1. D. C. Grahame, Chem. Rev. 41, 441 (1947).
2. J. T. G. Overbeek, Colloid Science, edited by H. R. Kruyt (Elsevier, Amsterdam, 1952).
3. P. Delahay, Double Layer and Electrode Kinetics (Interscience, New York, 1965).
4. R. Parsons, Chem. Rev. 90, 813 (1990).
5. B. V. Derjaguin and L. Landau, Physicochim. URSS 14, 633 (1941).
6. E. J. W. Verwey and J. T. G. Overbeek, Theory of the Stability of Lyophobic Colloids (Elsevier, Amsterdam, 1948).
7. R. Hogg, T. W. Healy, and L. R. White, Trans. Faraday Soc. 62, 1638 (1966).
8. D. McCormack, S. L. Camie, and D. Y. C. Chan, J. Colloid Interface Sci. 169, 177 (1995).
9. G. Binnig, C. F. Quate, and Ch. Gerber, Phys. Rev. Lett. 56, 930 (1986).
10. G. U. Lee, D. A. Kidwell, and R. J. Colton, Langmuir 10, 354 (1994).
11. E.-L. Florin, V. T. Moy, and H. E. Gaub, Science 264, 415 (1994).
12. U. Dammer, D. Anselmetti, M. Dreier, M. Hegner, W. Huber, J. Hurst, G. Misevic, and H.-J. Güntherodt, Force in Scanning Probe Methods, edited by H.-J. Güntherodt, D. Anselmetti, and E. Meyer (Kluwer Academic, Dordrecht, the Netherlands, 1995), p. 625.
13. M. Nonnenmacher, M. O'Boyle, and H. K. Wickramsinghe, Appl. Phys. Lett. 58, 2921 (1991).
14. M. Fujihira and H. Kawate, Thin Solid Films 242, 163 (1994).
15. H. Yokoyama and T. Inoue, Thin Solid Films 242, 33 (1994).
16. D. Rugar, H. J. Mamin, P. Guethner, S. E. Lambert, J. E. Stern, I. R. McFadyen, and T. Yogi, J. Appl. Phys. 68, 1169 (1990).
17. A. L. Weisenhorn, J. F. Macdougall, S. A. C. Gould, S. D. Cox, W. S. Wise, J. Massie, P. Maivald, V. B. Elings, G. D. Stucky, and P. K. Hansma, Science 247, 1330 (1990).
18. F. Schabert and A. Engel, Force in Scanning Probe Methods, edited by H.-J. Güntherodt, D. Anselmetti, and E. Meyer (Kluwer Academic, Dorchrecht, the Netherlands, 1995), p. 607.
19. W. A. Ducker, T. J. Senden, and R. M. Pashley, Nature 353, 239 (1991).
20. T. Arai and M. Fujihira, J. Electroanal. Chem. 374, 269 (1994).
21. T. Arai, D. Aoki, Y. Okabe, and M. Fujihira, Thin Solid Films (to be published).
22. J. N. Israelachvili, Intermolecular and Surface Forces, 2nd ed. (Academic, San Diego, 1991).
23. R. J. Hunter, Foundations of Colloid Science (Oxford University Press, New York, 1987).
24. T. W. Healy, D. Chan, and L. R. White, Pure Appl. Chem. 52, 1207 (1980).
25. Z. Borkowska and U. Stimming, J. Electroanal. Chem. 312, 237 (1991).
26. A. Hamelin, T. Vitanov, E. Sevastyanov, and A. Popov, J. Electroanal. Chem. 145, 225 (1983).
27. D. D. Bode, Jr., T. N. Andersen, and H. Eyring, J. Phys. Chem. 71, 792 (1967).
28. S. Strbac, A. Hamelin, and R. R. Adzic, J. Electroanal. Chem. 362, 47 (1993).
29. See p. 66 of Ref. 3 and D. C. Grahame and B. A. Soderberg, J. Chem. Phys. 22, 449 (1954).
30. H. Honbo, S. Sugawara, and K. Itaya, Anal. Chem. 62, 2424 (1990).
31. B. V. Derjaguin, Y. I. Rabinovich, and N. V. Churaev, Nature 272, 313 (1978).
32. J. P. Cleveland, S. Manne, D. Bocek, and P. K. Hansma, Rev. Sci. Instrum. 64, 403 (1993).
33. V. A. Parsegian and G. H. Weiss, J. Colloid Interface Sci. 81, 285 (1981).
34. C. J. Drummond and T. J. Senden, Colloids. Surf. A 87, 217 (1994).
35. T. J. Senden, C. J. Drummond, and P. Kekicheff, Langmuir 10, 358 (1994).