-
2
-
-
0343681011
-
-
C. M. Mate, G. M. McClelland, R. Erlandsson, and S. Chiang, Phys. Rev. Lett. 59, 1942 (1987).
-
(1987)
Phys. Rev. Lett.
, vol.59
, pp. 1942
-
-
Mate, C.M.1
McClelland, G.M.2
Erlandsson, R.3
Chiang, S.4
-
3
-
-
0011299673
-
Fundamentals of Friction: Macroscopic and Microscopic Processes
-
Kluwer Academic, Dordrecht
-
Fundamentals of Friction: Macroscopic and Microscopic Processes, edited by I. L. Singer and H. M. Pollock, NATO ASI Series E, Vol. 220 (Kluwer Academic, Dordrecht, 1992); Forces in Scanning Probe Methods, edited by H.-J. Guntherödt, D. Anselmetti, and E. Meyer, NATO ASI Series E, Vol. 286 (Kluwer Academic, Dordrecht, 1994).
-
(1992)
NATO ASI Series E
, vol.220
-
-
Singer, I.L.1
Pollock, H.M.2
-
4
-
-
0003692711
-
Forces in Scanning Probe Methods
-
Kluwer Academic, Dordrecht
-
Fundamentals of Friction: Macroscopic and Microscopic Processes, edited by I. L. Singer and H. M. Pollock, NATO ASI Series E, Vol. 220 (Kluwer Academic, Dordrecht, 1992); Forces in Scanning Probe Methods, edited by H.-J. Guntherödt, D. Anselmetti, and E. Meyer, NATO ASI Series E, Vol. 286 (Kluwer Academic, Dordrecht, 1994).
-
(1994)
NATO ASI Series E
, vol.286
-
-
Guntherödt, H.-J.1
Anselmetti, D.2
Meyer, E.3
-
5
-
-
85033845784
-
-
Park Scientific Instruments Inc., Sunny vale, CA; Digital Instruments Inc., Santa Barbara, CA; Nanosensors GmbH. Aidlingen Germany; Olympus Optical Company, Japan
-
Park Scientific Instruments Inc., Sunny vale, CA; Digital Instruments Inc., Santa Barbara, CA; Nanosensors GmbH. Aidlingen Germany; Olympus Optical Company, Japan.
-
-
-
-
6
-
-
21544451468
-
-
90
-
G. Meyer and N. M. Amer, Appl. Phys. Lett. 57, 2089 (90); O. Marti, J. Colchero, and J. Mlynek, Nanotechnology 1, 141 (1991).
-
Appl. Phys. Lett.
, vol.57
, pp. 2089
-
-
Meyer, G.1
Amer, N.M.2
-
7
-
-
0025497781
-
-
G. Meyer and N. M. Amer, Appl. Phys. Lett. 57, 2089 (90); O. Marti, J. Colchero, and J. Mlynek, Nanotechnology 1, 141 (1991).
-
(1991)
Nanotechnology
, vol.1
, pp. 141
-
-
Marti, O.1
Colchero, J.2
Mlynek, J.3
-
8
-
-
0026899680
-
-
W. F. Kolbe, D. F. Ogletree, and M. B. Salmeron, Ultramicroscopy 42-44, 1113 (1992); Q. Dai, R. Vollmer, R. W. Carpick, D. F. Ogletree, and M. Salmeron, Rev. Sci. Instrum. 66, 5266 (1995).
-
(1992)
Ultramicroscopy
, vol.42-44
, pp. 1113
-
-
Kolbe, W.F.1
Ogletree, D.F.2
Salmeron, M.B.3
-
9
-
-
0029409756
-
-
W. F. Kolbe, D. F. Ogletree, and M. B. Salmeron, Ultramicroscopy 42-44, 1113 (1992); Q. Dai, R. Vollmer, R. W. Carpick, D. F. Ogletree, and M. Salmeron, Rev. Sci. Instrum. 66, 5266 (1995).
-
(1995)
Rev. Sci. Instrum.
, vol.66
, pp. 5266
-
-
Dai, Q.1
Vollmer, R.2
Carpick, R.W.3
Ogletree, D.F.4
Salmeron, M.5
-
10
-
-
0027540056
-
-
J. P. Cleveland, S. Manne, D. Bocek, and P. K. Hansma, Rev. Sci. Instrum. 64, 403 (1993); T. J. Senden and W. A. Druker, Langmuir 10, 1003 (1994). M. Jaschke and H. J. Butt, Rev. Sci. Instrum. 66, 1258 (1995); H. J. Butt and M. Jaschke, Nanotechnology 6, 1 (1995). An incorrect implementation of this approach is also discussed in J. L. Hutter and J. Bechhoefer, Rev. Sci. Instrum. 64, 1868 (1993).
-
(1993)
Rev. Sci. Instrum.
, vol.64
, pp. 403
-
-
Cleveland, J.P.1
Manne, S.2
Bocek, D.3
Hansma, P.K.4
-
11
-
-
0028422252
-
-
J. P. Cleveland, S. Manne, D. Bocek, and P. K. Hansma, Rev. Sci. Instrum. 64, 403 (1993); T. J. Senden and W. A. Druker, Langmuir 10, 1003 (1994). M. Jaschke and H. J. Butt, Rev. Sci. Instrum. 66, 1258 (1995); H. J. Butt and M. Jaschke, Nanotechnology 6, 1 (1995). An incorrect implementation of this approach is also discussed in J. L. Hutter and J. Bechhoefer, Rev. Sci. Instrum. 64, 1868 (1993).
-
(1994)
Langmuir
, vol.10
, pp. 1003
-
-
Senden, T.J.1
Druker, W.A.2
-
12
-
-
0000858769
-
-
J. P. Cleveland, S. Manne, D. Bocek, and P. K. Hansma, Rev. Sci. Instrum. 64, 403 (1993); T. J. Senden and W. A. Druker, Langmuir 10, 1003 (1994). M. Jaschke and H. J. Butt, Rev. Sci. Instrum. 66, 1258 (1995); H. J. Butt and M. Jaschke, Nanotechnology 6, 1 (1995). An incorrect implementation of this approach is also discussed in J. L. Hutter and J. Bechhoefer, Rev. Sci. Instrum. 64, 1868 (1993).
-
(1995)
Rev. Sci. Instrum.
, vol.66
, pp. 1258
-
-
Jaschke, M.1
Butt, H.J.2
-
13
-
-
34347209835
-
-
J. P. Cleveland, S. Manne, D. Bocek, and P. K. Hansma, Rev. Sci. Instrum. 64, 403 (1993); T. J. Senden and W. A. Druker, Langmuir 10, 1003 (1994). M. Jaschke and H. J. Butt, Rev. Sci. Instrum. 66, 1258 (1995); H. J. Butt and M. Jaschke, Nanotechnology 6, 1 (1995). An incorrect implementation of this approach is also discussed in J. L. Hutter and J. Bechhoefer, Rev. Sci. Instrum. 64, 1868 (1993).
-
(1995)
Nanotechnology
, vol.6
, pp. 1
-
-
Butt, H.J.1
Jaschke, M.2
-
14
-
-
36449007442
-
-
J. P. Cleveland, S. Manne, D. Bocek, and P. K. Hansma, Rev. Sci. Instrum. 64, 403 (1993); T. J. Senden and W. A. Druker, Langmuir 10, 1003 (1994). M. Jaschke and H. J. Butt, Rev. Sci. Instrum. 66, 1258 (1995); H. J. Butt and M. Jaschke, Nanotechnology 6, 1 (1995). An incorrect implementation of this approach is also discussed in J. L. Hutter and J. Bechhoefer, Rev. Sci. Instrum. 64, 1868 (1993).
-
(1993)
Rev. Sci. Instrum.
, vol.64
, pp. 1868
-
-
Hutter, J.L.1
Bechhoefer, J.2
-
15
-
-
0000058768
-
-
Y. Q. Li, N. J. Tao, J. Pan, A. A. Garcia, and S. M. Lindsay, Langmuir 9, 637 (1993); J. A. Ruan and B. Bushan, Trans. ASME J. Tribology 116, 378 (1994).
-
(1993)
Langmuir
, vol.9
, pp. 637
-
-
Li, Y.Q.1
Tao, N.J.2
Pan, J.3
Garcia, A.A.4
Lindsay, S.M.5
-
16
-
-
0027947140
-
-
Y. Q. Li, N. J. Tao, J. Pan, A. A. Garcia, and S. M. Lindsay, Langmuir 9, 637 (1993); J. A. Ruan and B. Bushan, Trans. ASME J. Tribology 116, 378 (1994).
-
(1994)
Trans. ASME J. Tribology
, vol.116
, pp. 378
-
-
Ruan, J.A.1
Bushan, B.2
-
17
-
-
4243113920
-
-
discusses lateral force calibration, but in fact the article presents a method for calibration the lateral force deflection sensor given the (calculated) lateral force constant
-
S. Fujisawa, E. Kishi, Y. Sugawara, and S. Morita, Appl. Phys. Lett. 66, 23 (1995), discusses lateral force calibration, but in fact the article presents a method for calibration the lateral force deflection sensor given the (calculated) lateral force constant.
-
(1995)
Appl. Phys. Lett.
, vol.66
, pp. 23
-
-
Fujisawa, S.1
Kishi, E.2
Sugawara, Y.3
Morita, S.4
-
18
-
-
36449006239
-
-
J. E. Sader and L. R. White, J. Appl. Phys. 74, 1 (1993); J. M. Newmeister and W. Ducker, Rev. Sci. Instrum. 65, 2527 (1994); M. Labardi, M. Allegrini, C. Ascoli, C. Frediani, and M. Salerno (to be published).
-
(1993)
J. Appl. Phys.
, vol.74
, pp. 1
-
-
Sader, J.E.1
White, L.R.2
-
19
-
-
0000815047
-
-
J. E. Sader and L. R. White, J. Appl. Phys. 74, 1 (1993); J. M. Newmeister and W. Ducker, Rev. Sci. Instrum. 65, 2527 (1994); M. Labardi, M. Allegrini, C. Ascoli, C. Frediani, and M. Salerno (to be published).
-
(1994)
Rev. Sci. Instrum.
, vol.65
, pp. 2527
-
-
Newmeister, J.M.1
Ducker, W.2
-
20
-
-
36449006239
-
-
to be published
-
J. E. Sader and L. R. White, J. Appl. Phys. 74, 1 (1993); J. M. Newmeister and W. Ducker, Rev. Sci. Instrum. 65, 2527 (1994); M. Labardi, M. Allegrini, C. Ascoli, C. Frediani, and M. Salerno (to be published).
-
-
-
Labardi, M.1
Allegrini, M.2
Ascoli, C.3
Frediani, C.4
Salerno, M.5
-
21
-
-
85033833947
-
-
Rod Alley, Berkeley Sensor, Actuator Center, University of California at Berkeley, and Marco Tortonese, Park Scientific Instruments, Sunnyvale California (private communication)
-
Rod Alley, Berkeley Sensor, Actuator Center, University of California at Berkeley, and Marco Tortonese, Park Scientific Instruments, Sunnyvale California (private communication).
-
-
-
-
22
-
-
36449002856
-
-
J. E. Sader, I. Larson, P. Mulvaney, and L. R. White, Rev. Sci. Instrum. 66, 3789 (1995).
-
(1995)
Rev. Sci. Instrum.
, vol.66
, pp. 3789
-
-
Sader, J.E.1
Larson, I.2
Mulvaney, P.3
White, L.R.4
-
24
-
-
85033855265
-
-
Reference 14
-
Reference 14.
-
-
-
-
26
-
-
36449005258
-
-
R. J. Warmack, X.-Y. Zheng, T. Thundat, and D. P. Allison, Rev. Sci. Instrum. 65, 394 (1994).
-
(1994)
Rev. Sci. Instrum.
, vol.65
, pp. 394
-
-
Warmack, R.J.1
Zheng, X.-Y.2
Thundat, T.3
Allison, D.P.4
-
27
-
-
85033863567
-
-
Park Scientific Instruments Inc., Sunnyvale, California (private communication)
-
Dr. Marco Tortonese, Park Scientific Instruments Inc., Sunnyvale, California (private communication).
-
-
-
Tortonese, M.1
-
28
-
-
35949007151
-
-
S. S. Sheiko, M. Möller, E. M. C. M. Reuvekamp, and H. W. Zandbergen, Phys. Rev. B 48, 5675 (1993).
-
(1993)
Phys. Rev. B
, vol.48
, pp. 5675
-
-
Sheiko, S.S.1
Möller, M.2
Reuvekamp, E.M.C.M.3
Zandbergen, H.W.4
-
30
-
-
5544301719
-
-
R. Carpick, N. Agraït, D. F. Ogletree, and M. Salmeron, J. Vac. Sci. Technol. B 14, 1289 (1996).
-
(1996)
J. Vac. Sci. Technol. B
, vol.14
, pp. 1289
-
-
Carpick, R.1
Agraït, N.2
Ogletree, D.F.3
Salmeron, M.4
-
31
-
-
85033844047
-
-
AFM-100 control unit, RHK Technology Inc., Rochester Hills, MI
-
AFM-100 control unit, RHK Technology Inc., Rochester Hills, MI.
-
-
-
-
32
-
-
0001443786
-
-
S. M. Hues, C. F. Draper, K. P. Lee, and R. J. Colton, Rev. Sci. Instrum. 65, 1561 (1994); A. E. Holman, P. M. L. O. Scholte, W. Chr. Heerens, and F. Tuinstra, ibid. 66, 3208 (1995); J. Fu, ibid. 66, 3785 (1995).
-
(1994)
Rev. Sci. Instrum.
, vol.65
, pp. 1561
-
-
Hues, S.M.1
Draper, C.F.2
Lee, K.P.3
Colton, R.J.4
-
33
-
-
0001485049
-
-
S. M. Hues, C. F. Draper, K. P. Lee, and R. J. Colton, Rev. Sci. Instrum. 65, 1561 (1994); A. E. Holman, P. M. L. O. Scholte, W. Chr. Heerens, and F. Tuinstra, ibid. 66, 3208 (1995); J. Fu, ibid. 66, 3785 (1995).
-
(1995)
Rev. Sci. Instrum.
, vol.66
, pp. 3208
-
-
Holman, A.E.1
Scholte, P.M.L.O.2
Heerens, W.Chr.3
Tuinstra, F.4
-
34
-
-
0000785755
-
-
S. M. Hues, C. F. Draper, K. P. Lee, and R. J. Colton, Rev. Sci. Instrum. 65, 1561 (1994); A. E. Holman, P. M. L. O. Scholte, W. Chr. Heerens, and F. Tuinstra, ibid. 66, 3208 (1995); J. Fu, ibid. 66, 3785 (1995).
-
(1995)
Rev. Sci. Instrum.
, vol.66
, pp. 3785
-
-
Fu, J.1
-
35
-
-
0029409756
-
-
Q. Dai, R. Vollmer, R. W. Carpick, D. F. Ogletree, and M. Salmeron, Rev. Sci. Instrum. 66, 5266 (1995).
-
(1995)
Rev. Sci. Instrum.
, vol.66
, pp. 5266
-
-
Dai, Q.1
Vollmer, R.2
Carpick, R.W.3
Ogletree, D.F.4
Salmeron, M.5
-
36
-
-
85033845464
-
-
Park Scientific Instruments, Sunnyvale, CA
-
Park Scientific Instruments, Sunnyvale, CA.
-
-
-
-
37
-
-
0008854828
-
-
M. Binggeli and C. M. Mate, Appl. Phys. Lett. 65, 415 (1994); J. Hu, X.-D. Xiao, D. F. Ogletree, and M. Salmeron, Surf. Sci. 327, 358 (1995).
-
(1994)
Appl. Phys. Lett.
, vol.65
, pp. 415
-
-
Binggeli, M.1
Mate, C.M.2
-
38
-
-
0029291136
-
-
M. Binggeli and C. M. Mate, Appl. Phys. Lett. 65, 415 (1994); J. Hu, X.-D. Xiao, D. F. Ogletree, and M. Salmeron, Surf. Sci. 327, 358 (1995).
-
(1995)
Surf. Sci.
, vol.327
, pp. 358
-
-
Hu, J.1
Xiao, X.-D.2
Ogletree, D.F.3
Salmeron, M.4
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