Multipurpose sensor tips for scanning near-field microscopy

Applied Physics Letters

Volumn 68, Issue 25, 1996, Pages 3531-3533

  Mihalcea, C ^a   Scholz, W ^a   Werner, S ^a   Munster S ^a   Oesterschulze, E ^a   Kassing, R ^a  

^a UNIVERSITY OF KASSEL   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHROMIUM; MICROMACHINING; OPTICAL MICROSCOPY; OPTICAL SYSTEMS; SCANNING ELECTRON MICROSCOPY; SILICA; SILICON;

HOLLOW METAL TIPS; OPTICAL BEAM DEFLECTION SYSTEM; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SILICON CANTILEVERS;

SENSORS;

EID: 0030173080     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116520     Document Type: Review

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