Mapping of electrical double-layer force between tip and sample surfaces in water with pulsed-force-mode atomic force microscopy

Applied Physics Letters

Volumn 71, Issue 18, 1997, Pages 2632-2634

  Miyatani, Tatsuya ^a   Horii, Miki ^a   Rosa, Armin ^a,b   Fujihira, Masamichi ^a   Marti, Othmar ^b  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b UNIVERSITY OF ULM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; OXIDATION; OXIDES; OXYGEN; SILICA; SILICON NITRIDE; SURFACE PROPERTIES; VAPOR DEPOSITION; WATER;

ELECTRICAL DOUBLE LAYER; PULSED FORCE MODE ATOMIC FORCE MICROSCOPY; ULTRASONICATION;

ATOMIC FORCE MICROSCOPY;

EID: 0031551662     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120162     Document Type: Article

References (30)

1. For example, Forces in Scanning Probe Methods, edited by H.-J. Güntherodt, D. Anselmetti, and E. Meyer, NATO ASI, Series E: Applied Sciences, Vol. 286 (Kluwer Academic, Dordrecht, 1995).
2. H.-J. Butt, M. Jaschke, and W. Ducker, Bioelectrochem. Bioenergetics 38, 191 (1995).
3. R. J. Hunter, Foundation of Colloid Science (Oxford University, New York, 1989).
4. J. Israelachvili, Intermolecular & Surface Forces, 2nd ed. (Academic, London, 1991).
5. D. F. Evans and H. Wennerström, The Colloidal Domain Where Physics, Chemistry, Biology, and Technology Meet (VCH, New York, 1994).
6. B. V. Derjaguin and L. Landau, Acta Physicochim. URSS 14, 633 (1941).
7. E. J. W. Verway and J. Th. G. Overbeek, Theory of the Stability of Lyophobic Colloids (Elsevier, Amsterdam, 1948).
8. W. A. Ducker, T. J. Senden, and R. M. Pashley, Nature (London) 353, 239 (1991).
9. H.-J. Butt, Biophys. J. 60, 1438 (1991).
10. J. H. Hoh, J. P. Cleveland, C. B. Prater, J. P. Revel, and P. K. Hansma, J. Am. Chem. Soc. 114, 4917 (1992).
11. X.-Y. Lin, F. Creuzet, and H. Arribart, J. Phys. Chem. 97, 7272 (1993).
12. T. J. Senden and C. J. Drummond, Colloids Surf., A 94, 29 (1994).
13. T. Ishino, H. Hieda, K. Tanaka, and N. Gemma, Jpn. J. Appl. Phys., Part 1 33, L1552 (1994).
14. T. Arai and M. Fujihira, J. Vac. Sci. Technol. B 14, 1378 (1996).
15. T. J. Senden, C. J. Drummond, and P. Kekicheff, Langmuir 10, 358 (1994).
16. S. Manne, J. P. Cleveland, H. E. Gaub, G. D. Stucky, and P. K. Hansma, Langmuir 10, 4409 (1994).
17. I. A. Aksay, M. Trau, S. Manne, I. Honma, N. Yao, L. Zhou, P. Fenter, P. M. Eisenberger, and S. M. Gruner, Science 273, 892 (1996).
18. H.-J. Butt, Biophys. J. 63, 578 (1992).
19. K. O. van der Werf, C. A. J. Putman, B. G. Groth, and J. Greve, Appl. Phys. Lett. 65, 1195 (1994).
20. A. Rosa, S. Hild, and O. Marti, Polym. Prepr. Am. Chem. Soc. Div. Polym. Chem. 37, 616 (1996).
21. M. Radmacher, J. P. Cleveland, M. Fritz, H. G. Hansma, and P. K. Hansma, Biophys. J. 66, 2159 (1994).
22. M. Fujihira, T. Miyatani, and M. Horii, presented at Scanning Microscopy, Bethesda, Maryland, May 11-16, 1996 and to be published in Scanning Microscopy.
23. T. Arai, D. Aoki, Y. Okabe, and M. Fujihira, Thin Solid Films 273, 322 (1996).
24. C. A. Parks, Chem. Rev. 65, 177 (1965).
25. D. L. Harame, L. J. Bousse, J. D. Shott, and J. D. Meindl, IEEE Trans. Electron Devices 34, 1700 (1987).
26. M. Grattarola, G. Massobrio, and S. Martinoia, IEEE Trans. Electron Devices 39, 813 (1992).
27. L. Bergstrom and E. Bostedt, Colloids Surface 49, 183 (1990).
28. A. Marti, G. Hähner, and N. D. Spencer, Langmuir 11, 4632 (1995).
29. H. Yoshizawa, Y.-L. Chen, and J. N. Israelachvili, J. Phys. Chem. 97, 4128 (1993).
30. M. Fujihira and H. Kawate, Thin Solid Films 242, 163 (1994).